Semiconductor device and method of fabricating the same

ABSTRACT

In a semiconductor device including a laminate of a first insulating layer, a crystalline semiconductor layer, and a second insulating layer, characteristics of the device are improved by determining its structure in view of stress balance. In the semiconductor device including an active layer of the crystalline semiconductor layer having tensile stress on a substrate, tensile stress is given to the first insulating layer formed to be in close contact with a surface of the semiconductor layer at a substrate side, and compressive stress is given to the second insulating layer formed to be in close contact with a surface of the semiconductor layer at a side opposite to the substrate side.

BACKGROUND OF THE INVENTION

[0001] 1. Field of the Invention

[0002] The present invention relates to a semiconductor device includingan integrated circuit using thin film transistors on a substrate and amethod of fabricating the same. Particularly the invention relates to astructure of, for example, an electro-optical device typified by aliquid crystal display device and an electronic equipment incorporatingthe electro-optical device.

[0003] 2. Description of the Related Art

[0004] Development has been made on a semiconductor device typified byan active matrix type liquid crystal display device in which a number ofTFTs (thin film transistors) are arranged on a substrate. The TFT has alaminate structure including at least an active layer made of anisland-like semiconductor film, a first insulating layer provided at asubstrate side of the active layer, and a second insulating layerprovided at a side opposite to the substrate side of the active layer.Alternatively, the TFT has a laminate structure including an activelayer and a second insulating layer provided to be in close contact witha surface of the active layer at a side opposite to a substrate sidethereof, in which the first insulating layer is omitted.

[0005] The structure in which a gate electrode is provided so as toapply a predetermined voltage to the active layer through the firstinsulating layer is called an inverted stagger type or a bottom gatetype. On the other hand, the structure in which a gate electrode isprovided so as to apply a predetermined voltage to the active layerthrough the second insulating layer is called a forward stagger type ortop gate type.

[0006] It has been considered that a crystalline semiconductor capableof obtaining high mobility in addition to an amorphous semiconductor issuitable for a semiconductor film used for a TFT. Here, the crystallinesemiconductor includes a single crystal semiconductor, a polycrystalsemiconductor, and a microcrystal semiconductor. The insulating layer istypically formed of a material such as silicon oxide, silicon nitride,or silicon nitride oxide.

[0007] It is known, as the semiconductor film above, a semiconductordisclosed in Japanese Patent Application Laid Open No. Hei. 7-130652,No. Hei. 8-78329, No. Hei. 10-135468, or No. Hei. 10-135469.

[0008] It has been known that a thin film of the above materialfabricated by a well-known film forming technique, such as a CVD(Chemical Vapor Deposition), a sputtering method, and a vacuumevaporation method, includes internal stress. The internal stress hasbeen classified into intrinsic stress which the thin film intrinsicallyhas, and thermal stress due to a difference in thermal expansioncoefficient between the thin film and the substrate. It has beenpossible to neglect the thermal stress by controlling the thermalexpansion coefficient of the substrate and process temperature offabricating steps of the TFT. However, the generation mechanism of theintrinsic stress has not been necessarily clarified, and it has beenconsidered that the intrinsic stress is generated by a complicatedcombination of a phase change and composition change of the thin filmduring a growth process thereof, by heat treatment thereafter, and thelike.

[0009] In general, as shown in FIG. 3A, when a thin film is contractedwith respect to a substrate, the substrate is deformed by the influencewhile the thin film is located inside. Thus, the internal stress iscalled tensile stress. On the other hand, as shown in FIG. 3B, when thethin film is expanded, the substrate is compressed and is deformed whilethe thin film is located outside. Thus, the internal stress is calledcompressive stress. Like this, the definition of the internal stress hasbeen considered while the substrate is made the center. Also in thisspecification, the internal stress is set forth in accordance with thisdefinition.

[0010] It has been known that volume contraction occurs during a processof crystallization in a crystalline semiconductor film fabricated froman amorphous semiconductor film by a thermal annealing method or a laserannealing method. Although depending on the state of the amorphoussemiconductor film, it has been considered that the rate is about 0.1 to10%. As a result, there has been a case where the tensile stress isgenerated in the crystalline semiconductor film and its intensitybecomes about 1×10⁹ Pa. Besides, it has been known that the internalstress of an insulating film, such as a silicon oxide film, a siliconnitride film, or a silicon nitride oxide film, is variously changed fromthe compressive stress to the tensile stress by fabricating conditionsand subsequent heat treatment conditions.

[0011] In the technical field of a VLSI, a problem of stress has beenpointed out as one of causes of a poor device. With the improvement inintegration, it has inevitably become impossible to neglect an influenceof local stress. For example, it has been considered that a heavy metalimpurity is captured in a region where the stress is concentrated sothat various poor modes are caused, or dislocation generated to relievethe stress is also a factor to deteriorate the characteristics of adevice.

[0012] However, with respect to a TFT formed by laminating a pluralityof thin films, such as a semiconductor film and an insulating film, aninfluence caused by the interaction between the respective internalstresses of the thin films has not been sufficiently clarified.

[0013] Although there are some characteristic parameters expressing TFTcharacteristics, an electric field mobility is regarded as one standardindicating the level of performance. In order to realize a high fieldeffect mobility, the structure of a TFT and its fabricating process havebeen carefully studied in view of theoretical analysis and empiricalside. As especially important factors, it has been considered that it isnecessary to decrease a bulk defect density in a semiconductor layer andan interface level density at an interface between a semiconductor layerand an insulating layer to the utmost degree.

[0014] In order to decrease the bulk defect density and interface defectdensity formed in a crystalline semiconductor layer, the presentinventor has considered it to be a problem that the defect density isdecreased while internal stresses of respective thin films are takeninto consideration and a stress balance is taken, in addition tooptimization of fabricating conditions of a TFT.

SUMMARY OF THE INVENTION

[0015] An object of the present invention is to solve the foregoingproblem and to realize a TFT in which bulk defect density and interfacedefect density are decreased while distortion is not generated in acrystalline semiconductor layer.

[0016] As described in the Background of the Invention section, tensilestress is inherent in a crystalline semiconductor film fabricated froman amorphous semiconductor film. In a TFT including an active layer ofsuch a crystalline semiconductor film, it has been necessary to considera stress balance in order to laminate a gate insulating film, otherinsulating films and conductive films without generating distortion tothe crystalline semiconductor film.

[0017] The stress balance to be considered here is not such thatcomposed stress is made zero by compensating the internal stresses ofthe laminated thin films, but such that the thin films having inherentinternal stresses are laminated, with the crystalline semiconductor filmincluding tensile stress as the center, in such a direction thatdistortion does not occur in the crystalline semiconductor film.

[0018]FIGS. 4A and 4B are views for explaining the concept of thepresent invention. With respect to a crystalline semiconductor filmhaving tensile stress, the present inventor has considered to bedesirable that a thin film provided at a substrate side of thecrystalline semiconductor film has tensile stress (FIG. 4B). On theother hand, the present inventor has considered to be desirable that athin film provided on a surface of the crystalline semiconductor film ata side opposite to the substrate side has compressive stress (FIG. 4A).In all events, when the crystalline semiconductor film is contracted, ifa stress acts in a direction to expand this, it is expected thatdistortion occurs in crystal grain boundaries and micro cracks areformed. In such a case, dislocations and crystal defects are produced inthe region, and a number of unpaired bonds are formed. Thus, when thethin film provided at the substrate side of the crystallinesemiconductor film is made to have the tensile stress, the stress can begiven in the same direction as the direction in which the crystallinesemiconductor layer is contracted. On the contrary, when the thin filmprovided at the side opposite to the substrate side with respect to thecrystalline semiconductor film is made to have the compressive stress,the stress can be given in the same direction as the direction in whichthe crystalline semiconductor layer is contracted. That is, when such astructure is adopted that stress is given from other thin films in thedirection to contract the crystalline semiconductor film, the defectdensity can be effectively decreased.

[0019] For the purpose of controlling the internal stress of the thinfilm, it was sufficient if fabricating conditions and subsequent heattreatment conditions were considered. For example, in a silicon nitrideoxide film fabricated by a plasma CVD method, it was possible to changethe stress from the compressive stress to the tensile stress by changingthe composition ratio of nitrogen and oxygen or the hydrogen content. Ina silicon nitride film fabricated by a plasma CVD method, it waspossible to change the intensity of the internal stress by changing afilm deposition rate.

[0020] Further, the important point in consideration of the stressbalance was temperature control in all fabricating steps of a TFT. In athin film fabricated by a plasma CVD method or a sputtering method, evenif the film had a predetermined internal stress in the initial state,there was a case where the stress was changed to quite the oppositedirection internal stress by a substrate heating temperature in asubsequent step. On the contrary, it was also possible to change theinternal stress by using this property. For example, when a heattreatment at a temperature of 300° C. or more was applied to a siliconnitride film having compressive stress, it was also possible to changethe stress to tensile stress.

[0021] When a gate electrode was provided to apply a predeterminedvoltage through a first insulating layer provided at a substrate side ofan active layer made of an island-like semiconductor film formed on asubstrate, it was possible to form an inverted stagger type or bottomgate type TFT. When a gate electrode is provided to apply apredetermined voltage to an active layer through a second insulatinglayer provided at a side opposite to a substrate side of the activelayer, it was possible to form a forward stagger type or top gate typeTFT.

[0022] Although a material of an insulating film used for the firstinsulating layer or the second insulating layer was not particularlylimited, it was necessary to be able to control the internal stress insome way. For that purpose, a silicon nitride film, a silicon nitrideoxide film, a silicon oxide film, a tantalum oxide film, and the likewere suitable. Although a method of fabricating the silicon nitride filmis not limited, for example, in the case where the film is formed by aplasma CVD method, the film can be formed from a mixture gas of SiH₄,NH₃, N₂, and H₂. By changing a mixture ratio of the gas and dischargepower density, it was possible to fabricate the silicon nitride filmunder conditions of different film formation rates. As a measuringdevice of the internal stress, Model-30114 made by Ionic System Inc. wasused. A sample fabricated on a silicon wafer was used for measurement.

[0023] With respect to values of the internal stress, it is assume thatthe tensile stress is indicated by a positive value and the compressivestress is indicated by a negative value so that distinction can be made.According to data of FIG. 17, although any of silicon nitride filmsfabricated at a substrate temperature of 400° C. and at different filmdeposition rates had compressive stress, when a heat treatment at 500°C. for 1 hour was applied, it was possible to change the compressivestress to the tensile stress. Such change was realized when a heattreatment at a temperature higher than a substrate temperature at filmformation was carried out, and it was considered that densification ofthe silicon nitride film was the cause. Thus, it was possible tofabricate both of a film having the compressive stress and a film havingthe tensile stress for the silicon nitride film.

[0024] A silicon nitride oxide film was fabricated from a mixture gas ofSiH, and N₂O using a plasma CVD method. Also in this case, it waspossible to fabricate the silicon nitride oxide film by changing themixture ratio of gas or discharge power density to make film depositionrate different. FIG. 18 shows values of the internal stress of thesilicon nitride oxide films fabricated at a substrate temperature of400° C. Any of respective samples with different film deposition rateshad compressive stress. Even if a heat treatment at 450° C. for 4 hourswas further applied, the state was unchanged though the absolute valueof the compressive stress became small.

[0025] Although FIG. 19 similarly shows data of internal stress ofsilicon nitride oxide films, this drawing shows data of silicon nitrideoxide films fabricated by further mixing NH₃ to SiH₄ and N₂O. When theNH₃ gas was added at film formation, the characteristic was changed fromthe compressive stress to the side of the tensile stress. Further, whena heat treatment at 550° C. for 4 hours was applied to the samples, itwas possible to increase the tensile stress. The change like thiscorresponded to the change of composition ratio of a nitrogen contentand an oxygen content in the silicon nitride oxide film. Table 1 showsthe result of measurement of the content of each element in the siliconnitride oxide film measured by Rutherford backscattering method (RBS).TABLE 1 CONTENTS (atomic %) CONDITIONS H N O Si SAMPLE 1 NH₃ = 0 SCCM1.5 7.0 59.5 32.0 SAMPLE 2 NH₃ = 30 SCCM 16.5 24.0 26.5 33.0 SAMPLE 3NH₃ = 100 SCCM 15.5 44.1 6.0 34.4

[0026] When the nitrogen content and the oxygen content in a siliconnitride oxide film were 7 atomic % and 59.5 atomic %, respectively, itwas possible to make the nitrogen content and the oxygen content 24.0atomic % and 26.5 atomic %, respectively, by adding the NH₃ gas of 30SCCM at film formation. Besides, it was possible to make the nitrogencontent and the oxygen content 44.1 atomic % and 6.0 atomic %,respectively, by adding the NH₃ gas of 100 SCCM. That is, by adding theNH₃ gas, it was possible to increase the nitrogen content in the siliconnitride oxide film and to decrease the oxygen content. At this time, itwas possible to change the compressive stress to the tensile stress.When the composition of various silicon nitride oxide films obtained byadding the NH₃ gas were investigated, in any film, the composition wassuch that the silicon content was about 34 atomic %, the hydrogencontent was about 16 atomic %, and the sum of nitrogen and oxygencontent was about 50 atomic %. The films having the nitrogen content ofnot less than 25 atomic % and less than 50 atomic % obviously exhibitedthe tensile stress, and the films having the nitrogen content of notless than 5 atomic % and less than 25 atomic % exhibited the compressivestress. It was possible to consider the change of the internal stress byheat treatment while relating it to the change of the hydrogen contentin the film as shown in FIG. 20. The data of FIG. 20 show the result ofmeasurement by FT-IR to the hydrogen content in the silicon nitrideoxide films fabricated by adding the NH₃ gas. By a heat treatment at500° C. for 1 hour, hydrogen bonded with silicon is first released. Thistendency becomes remarkable as the substrate temperature (see Tsubexpressed at the upper right of each graph of FIG. 20) at film formationbecomes low. It is expected that when hydrogen bonded with silicon isreleased, unpaired bonds are produced and the tensile stress isstrengthened by the interaction (attractive force) of the unpairedbonds. Like this, it was also possible to change the internal stress bydecreasing the hydrogen content in the film.

[0027] Like this, by controlling the film formation rate, by applyingthe heat treatment at a temperature higher than a substrate temperatureof film formation, or by controlling film formation conditions, it waspossible to control the internal stress. As is well known, a TFT iscompleted by repeating thin film formation and an etching process, andthe important point here was the control of process temperature over allthe fabricating steps. It was sufficient if the highest temperature ofthe process was determined in view of the internal stresses of thinfilms to be laminated.

[0028] A semiconductor device of the present invention comprises anactive layer of an island-like semiconductor film formed over asubstrate; a first insulating layer provided at a substrate side of theactive layer and including a first silicon nitride oxide film having anitrogen content higher than an oxygen content and a second siliconnitride oxide film having a nitrogen content lower than an oxygencontent; and a second insulating layer provided to be in contact with asurface of the active layer at a side opposite to the substrate side andincluding a plurality of third silicon nitride oxide films each having anitrogen content lower than an oxygen content.

[0029] In the semiconductor device of the present invention, the activelayer has tensile stress, the first silicon nitride oxide film of thefirst insulating layer in which the nitrogen content is higher than theoxygen content has tensile stress, and each of the plurality of thirdsilicon nitride oxide films of the second insulating layer in which thenitrogen content is lower than the oxygen content has compressivestress. It is desirable that a difference in absolute values of thetensile stresses between the first insulating layer and thesemiconductor layer, or a difference in absolute values between thecompressive stress of the second insulating layer and the tensile stressof the semiconductor layer is within 5×10⁸ Pa.

[0030] Besides, in the semiconductor device of the present invention,the nitrogen content of the first silicon nitride oxide film in whichthe nitrogen content is higher than the oxygen content is not less than25 atomic % and less than 50 atomic %, and the nitrogen content of eachof the plurality of third silicon nitride oxide films in which thenitrogen content is lower than the oxygen content is not less than 5atomic % and less than 25 atomic %.

BRIEF DESCRIPTION OF THE DRAWINGS

[0031]FIGS. 1A to 1C are sectional views of TFTs of Embodiment Mode 1.

[0032]FIGS. 2A to 2D are sectional views of TFTs of Embodiment Mode 2.

[0033]FIGS. 3A and 3B are views for explaining the definition ofinternal stress of a conventional thin film.

[0034]FIGS. 4A and 4B are views for explaining the concept of a stressbalance of the present invention.

[0035]FIGS. 5A to 5 e are sectional views showing fabricating steps of aTFT of Embodiment 1.

[0036]FIGS. 6A to 6D are sectional views showing fabricating steps ofthe TFT of Embodiment 1.

[0037]FIGS. 7A to 7D are sectional views showing fabricating steps ofthe TFT of Embodiment 1.

[0038]FIGS. 8A to 8C are a top view, a sectional view, and a circuitdiagram of a CMOS circuit, respectively, of Embodiment 2.

[0039]FIGS. 9A to 9E are sectional views showing fabricating steps of aTFT of Embodiment 3.

[0040]FIGS. 10A to 10C are sectional views showing fabricating steps ofthe TFT and a top view of a CMOS circuit of Embodiment 3.

[0041]FIGS. 11A to 11C are sectional views showing fabricating steps ofan active matrix substrate of Embodiment 4.

[0042]FIGS. 12A to 12C are sectional views showing fabricating steps ofthe active matrix substrate of Embodiment 4.

[0043]FIGS. 13A and 13B are sectional views of the active matrixsubstrate of Embodiment 4.

[0044]FIGS. 14A and 14B are sectional views of an active matrix typeliquid crystal display device of Embodiment 5.

[0045]FIG. 15 is a perspective view of an active matrix substrate ofEmbodiment 5.

[0046]FIGS. 16A and 16B are a top view of a pixel portion and a top viewof a CMOS circuit, respectively, of Embodiment 5.

[0047]FIG. 17 is a characteristic view of internal stress of a siliconnitride film of the present invention.

[0048]FIG. 18 is a characteristic view of internal stress of a siliconnitride oxide film of the present invention.

[0049]FIG. 19 is a characteristic view of internal stress of a siliconnitride oxide film of the present invention.

[0050]FIG. 20 is a characteristic view for explaining the change ofhydrogen content in silicon nitride oxide films by heat treatment of thepresent invention.

[0051]FIGS. 21A to 21C are views for explaining Embodiment 6 of thepresent invention.

[0052]FIGS. 22A to 22E are views for explaining Embodiment 6 of thepresent invention.

[0053]FIGS. 23A to 23E are views for explaining Embodiment 6 of thepresent invention.

[0054]FIGS. 24A to 24D are views for explaining Embodiment 6 of thepresent invention.

[0055]FIGS. 25A to 25F are views showing examples of semiconductordevices of Embodiment 7.

[0056]FIG. 26 is a view showing an example of light transmittancecharacteristics of an antiferroelectric mixed liquid crystal ofEmbodiment 8.

[0057]FIGS. 27A and 27B are a top view and a sectional view showing astructure of an EL display device of Embodiment 10.

[0058]FIGS. 28A and 28B are sectional views of pixel portions of ELdisplay devices of Embodiments 10 and 11, respectively.

[0059]FIGS. 29A and 29B are a top view and a circuit diagram of a pixelportion of an EL display device of Embodiment 10.

[0060]FIGS. 30A to 30C are circuit diagrams showing examples of pixelportions of EL display devices of Embodiment 12.

[0061]FIG. 31 is a view showing an example of a semiconductor device ofEmbodiment 9.

[0062]FIGS. 32A to 32C are views showing examples of semiconductordevices of Embodiment 7.

[0063]FIGS. 33A to 33D are views showing examples of semiconductordevices of Embodiment 7.

DETAILED DESCRIPTION OF THE INVENTION

[0064] [Embodiment Mode 1]

[0065] A first embodiment mode for carrying out the invention will bedescribed with reference to FIGS. 1A to 1C. In FIGS. 1A to 1C, a firstinsulating layer 102 is formed on a substrate 101 having an insulatingsurface. The first insulating layer 102 is formed of a nitrogen-richsilicon nitride oxide film 102 a having a nitrogen content of not lessthan 25 atomic % and less than 50 atomic % and a silicon nitride oxidefilm 102 b having a nitrogen content of not less than 5 atomic % andless than 25 atomic % in this order from the substrate. Thenitrogen-rich silicon nitride oxide film 102 a has a tensile stress of5×10⁸ Pa to 2×10⁹ Pa. The silicon nitride oxide film 102 b is a filmhaving a compressive stress of not higher than −5×10⁸ Pa, and isprovided between the nitrogen-rich silicon nitride oxide film 102 a andan active layer 103 so as to slightly relieve the action of stress.

[0066] The active layer 103 is a crystalline semiconductor filmfabricated from an amorphous semiconductor film by a method such as alaser annealing method or a thermal annealing method, and has inevitablytensile stress without limitations to a particular fabricating method.As the need arises, a channel formation region 103 a, LDD regions 103 b,a source region 103 c, and a drain region 103 d are provided. Contactholes are provided in part of a second insulating layer 104 so that asource electrode 106 and a drain electrode 107 are provided.

[0067] Although a second insulating layer 104 is laminated on the activelayer 103, in the case of top gate type TFTs as shown in FIGS. 1A to 1C,a gate insulating film 104 a is first provided, which is formed of asilicon nitride oxide film having a nitrogen content of not less than 5atomic % and less than 25 atomic %. A gate electrode is provided thereonat a predetermined position.

[0068] In FIG. 1A, a silicon nitride film 104 b and a silicon oxide film104 c are formed thereon. The silicon nitride film 104 b was formedwhile controlling the film formation rate, so that the compressivestress was given. The compressive stress of this film 104 b was withinthe range of −2×10⁸ to 1×10⁹ Pa.

[0069]FIG. 1B shows a structure in which a silicon oxide film 104 d anda silicon nitride film 104 e are formed on the gate insulating film 104a. The silicon oxide film 104 d has a stress of 5×10⁹ Pa or less, andcompressive stress may be applied by the silicon nitride film 104 eformed thereon.

[0070]FIG. 1C shows a structure in which a silicon nitride film 104 f, asilicon oxide film 104 g, a silicon nitride film 104 h, and a siliconnitride oxide film 104 i are formed on the gate insulating film 104 a.The silicon nitride films 104 f and 104 h, and the silicon nitride oxidefilm 104 i having a nitrogen content of not less than 5 atomic % andless than 25 atomic % have compressive stress. By providing the filmshaving the compressive stress on the source electrode 106 and the drainelectrode 107, it was possible to more effectively give the stress tothe active layer 103.

[0071] [Embodiment Mode 2]

[0072] A second embodiment mode for carrying out the invention will bedescribed with reference to FIGS. 2A to 2D. In FIGS. 2A to 2D, a firstinsulating layer 202 is formed on a substrate 201 having an insulatingsurface. Similarly to Embodiment Mode 1, a nitrogen-rich silicon nitrideoxide film 202 a having a nitrogen content of not less than 25 atomic %and less than 50 atomic %, and a silicon nitride oxide film 202 b havinga nitrogen content of not less than 5 atomic % and less than 25 atomic %are provided. The nitrogen-rich silicon nitride oxide film 202 a hastensile stress. An active layer 203 is a crystalline semiconductor filmfabricated from an amorphous semiconductor film by a method such as alaser annealing method or a thermal annealing method, and as the needarises, a channel formation region 203 a, LDD regions 203 b, a sourceregion 203 c, and a drain region 203 d are provided. Contact holes areprovided in part of a second insulating layer 204 so that a sourceelectrode 206 and a drain electrode 207 are provided. Although thesecond insulating layer 204 is laminated on the active layer 203, in thecase of top gate type TFTs as shown in FIGS. 2A to 2D, a gate insulatingfilm 204 a is first provided, which is formed of a silicon nitride oxidefilm having a nitrogen content of not less than 5 atomic % and less than25 atomic %. A gate electrode is provided thereon at a predeterminedposition.

[0073]FIG. 2A shows a structure in which a silicon oxide film 204 b anda silicon nitride oxide film 204 c are formed on the gate insulatingfilm 204 a. The nitrogen content of the silicon nitride oxide film 204 cwas made not less than 5 atomic % and less than 25 atomic %, so thatcompressive stress was generated. Thus, such a structure is made thatthe stress is applied to the active layer 203 from the nitrogen-richsilicon nitride oxide film 202 a and the silicon nitride oxide film 204c. Here, the film having the compressive stress was provided on thesource electrode 206 and the drain electrode 207, so that it waspossible to more effectively give the stress to the active layer 203.

[0074]FIG. 2B shows a structure in which a silicon nitride oxide film204 d, a silicon oxide film 204 e, and a silicon nitride oxide film 204f are provided on the gate insulating film 204 a. Then, such a structureis made that stress is applied to the active layer 203 from thenitrogen-rich silicon nitride oxide film 202 a and the silicon nitrideoxide films 204 d and 204 f.

[0075]FIG. 2C shows a structure in which a silicon oxide film 204 g, asilicon nitride oxide film 204 h having compressive stress, and asilicon nitride oxide film 204 i are provided on the gate insulatingfilm 204 a. FIG. 2D shows a structure in which a silicon oxide film 204j, a silicon nitride oxide film 204 k, and a silicon nitride oxide film204 l are provided.

[0076] In order to change the internal stress from the tensile stress tothe compressive stress by controlling the composition ratio of thenitrogen content and the oxygen content of the silicon nitride oxidefilm, it was sufficient if the mixture ratio of gases of SiH₄, N₂O, andNH₃ used for film formation was changed, which was easily performed. Inthe case where the silicon nitride oxide film having an internal stressof 5×10⁸ Pa or more in absolute value was provided, it was appropriatethat the film was not formed to be in contact with the active layer 203,but was provided through a film having a low stress, such as a siliconoxide film.

[0077] [Embodiment 1]

[0078] This embodiment will be described with reference to FIGS. 5A to7D as an example of a bottom gate type TFT. First, a glass substrate,for example, a #1737 substrate of Corning Inc. was prepared as asubstrate 601. A gate electrode 602 was formed on the substrate 601.Here, a tantalum (Ta) film was formed to a thickness of 200 nm by usinga sputtering method. The gate electrode 602 may be a two-layer structureof a tantalum nitride film (film thickness of 50 nm) and a Ta film (filmthickness of 250 nm). The Ta film was formed by a sputtering methodusing an Ar gas while Ta was used as a target, and when sputtering wasmade with a mixture gas of the Ar gas added with a Xe gas, it waspossible to make an absolute value of an internal stress 2×10⁸ Pa orless (FIG. 5A).

[0079] Then, a first insulating layer 603 and an amorphous semiconductorlayer 604 were continuously formed without opening to the air. The firstinsulating layer 603 was formed of a nitrogen-rich silicon nitride oxidefilm 603 a (film thickness of 50 nm) and a silicon nitride oxide film603 b (film thickness of 125 nm). The nitrogen-rich silicon nitrideoxide film 603 a was formed by plasma CVD method from a mixture gas ofSiH₄, N₂O and NH₃. The amorphous semiconductor layer 604 was also formedto a thickness of 20 to 100 nm, preferably 40 to 75 nm by using theplasma CVD method (FIG. 5B).

[0080] Then, a heat treatment at 450 to 550° C. for 1 hour was carriedout. By this heat treatment, hydrogen was released from the firstinsulating layer 603 and the amorphous semiconductor layer 604, so thatit was possible to give tensile stress. Thereafter, a crystallizing stepwas carried out for the amorphous semiconductor layer 604, so that acrystalline semiconductor layer 605 was formed. In the crystallizingstep here, a laser annealing method or a thermal annealing method may beused. In the laser annealing method, for example, KrF excimer laserlight (wavelength 248 nm) was used, a linear beam was formed, andcrystallization of the amorphous semiconductor layer was carried outunder the conditions that an oscillation pulse frequency was 30 Hz, alaser energy density was 100 to 500 mJ/cm², and an overlap rate of thelinear beam was 96%. Here, as the amorphous semiconductor layer wascrystallized, volume shrinkage occurred, and the tensile stress of theformed crystalline semiconductor layer was increased (FIG. 5C).

[0081] Next, an insulating film 606 was formed to be in contact with thethus formed crystalline semiconductor layer 605. Here, a silicon nitrideoxide film was formed to a thickness of 200 nm. Thereafter, by apatterning method using exposure from a rear surface, a resist mask 607was formed to be in contact with the insulating film 606. Here, the gateelectrode 602 became a mask, so that the resist mask 607 was formed in aself-aligning manner. As shown in the drawing, the size of the resistmask became slightly smaller than the width of the gate electrode sincelight went around (FIG. 5D).

[0082] The insulating film 606 was etched by using the resist mask 607,and after a channel protecting film 608 was formed, the resist mask 607was removed. By this step, the surface of the crystalline semiconductorlayer 605 except a region being in contact with the channel protectingfilm 608 was exposed. This channel protecting film 608 functioned toprevent addition of an impurity into a channel region in a subsequentimpurity addition step (FIG. 5E).

[0083] Next, a resist mask 609 covering a part of an n-channel TFT and ap-channel TFT was formed by patterning using a photomask, and a step ofadding an impurity element to give an n-type was carried out to theregion where the surface of the crystalline semiconductor layer 605 wasexposed. Then, a first impurity region (n⁺-type region) 610 a wasformed. In this embodiment, since phosphorus was used as the impurityelement to give the n-type, phosphine (PH₃) was used in an ion dopingmethod, and the dose amount was made 5×10¹⁴ atoms/cm² and theacceleration voltage was made 10 keV. The pattern of the resist mask 609was suitably set by an operator, so that the width of the n⁺-type regionwas determined, and it was possible to easily obtain an n⁻-type regionhaving a desired width and a channel formation region (FIG. 6A).

[0084] After the resist mask 609 was removed, a second insulating film611 was formed. Here, a silicon nitride oxide film (film thickness of 50nm) having a nitrogen content of not less than 5 atomic % and less than25 atomic % and having compressive stress, which was shown in theembodiment 1, was formed by a plasma CVD method. The silicon nitrideoxide film had the compressive stress (FIG. 6B).

[0085] Next, a step of adding an impurity element to give the n-type wascarried out to the crystalline semiconductor layer having the surface onwhich the masking insulating film 611 was provided, so that a secondimpurity region (n⁻-type region) 612 was formed. However, in order toadd the impurity through the masking insulating film 611 to thecrystalline semiconductor layer thereunder, it was necessary to suitablyset the condition in view of the thickness of the masking insulatingfilm 611. Here, the dose amount was 3×10¹³ atoms/cm², and theacceleration voltage was made 60 keV. The second impurity regions 612formed in this way functioned as LDD regions (FIG. 6C).

[0086] Next, a resist mask 614 covering the n-channel TFT was formed,and a step of adding an impurity element to give a p-type was carriedout to a region where the p-channel TFT was to be formed. Here, boron(B) was added by an ion doping method using diborane (B₂H₆). The doseamount was 4×10¹⁵ atoms/cm², and the acceleration voltage was made 30keV (FIG. 6D).

[0087] Thereafter, after a step of activating the impurity elements by alaser annealing method or a thermal annealing method was carried out, aheat treatment (300 to 500° C., 1 hour) was carried out in a hydrogenatmosphere, so that the whole was hydrogenated (FIG. 7A).

[0088] Hydrogenating may be carried out by hydrogen produced by makingplasma. Thereafter, the channel protecting film 608 and the maskinginsulating film 611 were selectively removed by a fluoric acid basedetching solution, and the crystalline semiconductor layer was etchedinto a desired shape by a well-known patterning technique (FIG. 7B).

[0089] Through the foregoing steps, a source region 615, a drain region616, LDD regions 617 and 618, and a channel formation region 619 of then-channel TFT were formed. Besides, a source region 621, a drain region622, and a channel formation region 620 of the p-channel TFT wereformed. Next, a second insulating layer was formed to cover then-channel TF and the p-channel TFT. In the second insulating layer, aninsulating film 623 made of a silicon oxide film was first formed to athickness of 1000 nm (FIG. 7C).

[0090] Then, contact holes were formed, and source electrodes 624 and626, and drain electrodes 625 and 627 were formed. Further, as a secondinsulating layer, a silicon nitride oxide film 628 was formed on theinsulating film 623 made of the silicon oxide film to cover the sourceelectrodes 624 and 626, and the drain electrodes 625 and 627. Thesilicon nitride oxide film 628 was made to have a nitrogen content ofnot less than 5 atomic % and less than 25 atomic %, and was made to havethe compressive stress. After the state shown in FIG. 7D was obtained, aheat treatment was finally carried out in a hydrogen atmosphere, and thewhole was hydrogenated, so that the n-channel TFT and the p-channel TFTwere completed. It was also possible to realize the hydrogenating stepby exposing the whole to a hydrogen atmosphere of plasma.

[0091] [Embodiment 2]

[0092] An example of a semiconductor device including an n-channel TFTand a p-channel TFT using the fabricating steps of Embodiment 1 will bedescribed with reference to FIGS. 8A to 8C. FIGS. 8A to 8C show aninverter circuit as a basic structure of a CMOS circuit. By combiningsuch an inverter circuit, it is possible to construct a basic circuitsuch as a NAND circuit and a NOR circuit, or to construct a furthercomplicated shift register circuit, buffer circuit, and the like. FIG.8A is a view corresponding to a top view of a CMOS circuit, and FIG. 8Bis a sectional structural view taken along dotted line A-A′ in FIG. 8A.

[0093] In FIG. 8B, both the n-channel TFT and the p-channel TFT areformed on the same substrate. In the p-channel TFT, a gate electrode 902is formed, and a nitrogen-rich silicon nitride oxide film 903 havingtensile stress and a silicon nitride oxide film 904 are provided as afirst insulating layer thereon. An active layer made of a crystallinesemiconductor film is formed to be in contact with the first insulatinglayer, and a p⁺-region 912 (drain region), a p⁺-region 915 (sourceregion), and a channel formation region 914 are provided. A secondinsulating layer is provided to be in contact with this semiconductorlayer, and here, a silicon oxide film 917 and a silicon nitride oxidefilm 919 are formed. A source electrode 920 and a drain electrode 918are formed through contact holes provided in the silicon oxide film. Onthe other hand, in an active layer of the n-channel TFT, an n⁺-typeregion 905 (source region), an n⁺-type region 911 (drain region), achannel formation region 909, and an n⁻-type region between the n⁺-typeregion and the channel formation region are provided. Similarly, contactholes are formed in the silicon oxide film 917 as an interlayerinsulating film, and a source electrode 916 and a drain electrode 918are provided.

[0094] Such a CMOS circuit can be applied to a peripheral driver circuitof an active matrix type liquid crystal display device, a driver circuitfor an EL (Electro luminescence) type display device, a reading circuitof a contact-type image sensor, and the like.

[0095] [Embodiment 3]

[0096] This embodiment will be described with reference to FIGS. 9A to9E and FIGS. 10A to 10C. Here, a description will be made on an examplein which an n-channel TFT and a p-channel TFT are fabricated on the samesubstrate, and an inverter circuit as a basic structure of a CMOScircuit is formed. In FIG. 9A, a first insulating layer is formed on asubstrate 701 having an insulating surface. Here, a nitrogen-richsilicon nitride oxide film 702 having a nitrogen content of not lessthan 25 atomic % and less than 50 atomic % was formed to a thickness of20 to 100 nm, typically a thickness of 50 nm, and a silicon nitrideoxide film 703 having a nitrogen content of not less than 5 atomic % andless than 25 atomic % was formed to a thickness of 50 to 500 nm,typically 150 to 200 nm. The nitrogen-rich silicon nitride oxide film702 has tensile stress. A second island-like semiconductor film 704, afirst island-like semiconductor film 705, and a gate insulating film 706were formed. The gate insulating 706 was formed of a silicon nitrideoxide film. The island-like semiconductor films were formed byseparating a crystalline semiconductor film, which was formed from anamorphous semiconductor film by a method such as a laser annealingmethod or a thermal annealing method, by a well-known technique (FIG.9A).

[0097] As a semiconductor material which can be applied here, silicon(Si), germanium (Ge), silicon germanium alloy, and silicon carbide canbe enumerated. In addition, a compound semiconductor material such asgallium arsenide may be used. The semiconductor film is formed to athickness of 10 to 100 nm, typically 50 nm. Hydrogen is contained in anamorphous semiconductor film formed by a plasma CVD method at a rate of10 to 40 atomic %. Although the amorphous semiconductor film hasarbitrary internal stress from compressive stress to tensile stress byfabricating conditions, when a step of heat treatment at 400 to 500° C.was carried out prior to a step of crystallization to remove hydrogenfrom the film, the internal stress was almost changed to the tensilestress.

[0098] Then, resist masks 707 and 708 covering the second island-likesemiconductor film 704 and the channel formation region of the firstisland-like semiconductor film 705 were formed. At this time, a resistmask 709 may also be formed on a region where a wiring is formed. Then,a step of forming a second impurity region was carried out by adding animpurity element to give an n-type. Here, phosphorus (P) was added by anion doping method using phosphine (PH₃). In this step, for the purposeof adding phosphorus through the gate insulating film 706 to theisland-like semiconductor layer thereunder, the acceleration voltage wasset as high as 80 keV. It is preferable that the concentration ofphosphorus added to the island-like semiconductor layer is within therange of 1×10¹⁶ to 1×10¹⁹ atoms/cm³, and here, it was made 1×10¹⁸atoms/cm³. Then, regions 710 and 711 where phosphorus was added into thesemiconductor layer were formed. Part of the regions functioned as LDDregions (FIG. 9B).

[0099] Then, a conductive layer 712 was formed on the surface of thegate insulating film 706. The conductive layer 712 is formed using aconductive material containing an element selected from Ta, Ti, Mo, andW as its main ingredient. It is appropriate that the thickness of theconductive layer 712 is 100 to 500 nm, preferably 150 to 400 nm. Thethin film of Ta, Ti, W, Mo, or the like fabricated by a sputteringmethod had a high compressive stress. However, it was possible toeffectively decrease the stress by adding an Xe gas in addition to an Argas at the time of film formation by sputtering (FIG. 9C).

[0100] Next, resist masks 713 to 716 were formed. The resist mask 713 isfor forming a gate electrode of the p-channel TFT, and the resist masks715 and 716 are for forming a gate wiring and a gate bus line. Theresist mask 714 was formed to cover the whole surface of the firstisland-like semiconductor film 705, and was provided to be made a maskto prevent addition of an impurity in a next step. An unnecessaryportion of the conductive layer 712 was removed by a dry etching method,so that a second gate electrode 717, a gate wiring 719, a gate bus line720 were formed. Here, in the case where a residual after etchingremained, it was appropriate that an ashing process was carried out.While the resist masks 713 to 716 were made to remain as they were, animpurity element to give a p-type was added to a part of the secondisland-like semiconductor film 704 where the p-channel TFT was formed,so that a third impurity region was formed.

[0101] Here, boron was used as the impurity element and was added by anion doping method using diborane (B₂H₆). Also in this step, theacceleration voltage was made 80 keV, and boron was added at aconcentration of 2×10²⁰ atoms/cm³. As shown in FIG. 9D, third impurityregions 721 and 722 where boron was added at a high concentration wereformed.

[0102] After the resist masks provided in FIG. 9D were removed, resistmasks 723 to 725 were again formed. These are for forming a gateelectrode of the n-channel TFT, and a first gate electrode 726 wasformed by a dry etching method. At this time, the first gate electrode726 was formed to overlap with part of the second impurity regions 710and 711 through the gate insulating film (FIG. 9E).

[0103] Next, resist masks 729 to 731 were formed. The resist mask 730was formed to cover the first gate electrode 726 and into such a shapethat it overlapped with part of the second impurity regions 710 and 711.This is for determining an offset amount of LDD regions. Then, a step offorming a first impurity region was carried out by adding an impurityelement to give an n-type, so that a first impurity region 732 whichbecame a source region and a first impurity region 733 which became adrain region were formed. Also in this step, for the purpose of addingphosphorus through the second insulating layer 706 to the semiconductorlayer thereunder, the acceleration voltage was set as high as 80 keV.The concentration of phosphorus in this region is high as compared withthe step of adding the first impurity element to give the n-type, and itis preferable that the concentration is made 1×10¹⁹ to 1×10²¹ atoms/cm³,and here, it was made 1×10²⁰ atoms/cm³ (FIG. 10A).

[0104] Then, a silicon oxide film 734 with a thickness of 1000 nm wasformed on the surfaces of the gate insulating film 706, the first andsecond gate electrodes 726 and 717, a gate wiring 727, and a gate busline 728. Thereafter, a heat treatment was carried out. It was necessaryto carry out this treatment in order to activate the impurity elementsadded at each concentration and to give the n-type or p-type. This stepmay be carried out by a thermal annealing method using an electricheating furnace, the foregoing laser annealing method using an excimerlaser, or a rapid thermal annealing method (RTA method) using a halogenlamp. However, in the laser annealing method, although activation can bemade at a low substrate heating temperature, it is difficult to makeactivation to a region concealed under the gate electrode. Here, theactivation was made by the thermal annealing method. The heat treatmentwas carried out in a nitrogen atmosphere at 300 to 600° C., preferably350 to 550° C., here, 450° C. for 2 hours. In this heat treatment,hydrogen of 3 to 90% may be added in the nitrogen atmosphere. Further,it is appropriate that after the heat treatment, a step of hydrogenatingprocess is carried out in a hydrogen atmosphere of 3 to 100% at 150 to500° C., preferably 300 to 450° C. for 2 to 12 hours. The hydrogenatingprocess may be carried out by hydrogen produced by making plasma at asubstrate temperature of 150 to 500° C., preferably 200 to 450° C. Inall events, hydrogen compensated defects remaining in the semiconductorlayer or its interface, so that it was possible to improve thecharacteristics of the TFT.

[0105] After a predetermined resist mask was formed, the silicon oxidefilm 734 was subjected to an etching process so that contact holesreaching a source region and a drain region of each TFT were formed.Then, source electrodes 736 and 737 and a drain electrode 738 wereformed. Although not shown, in this embodiment, the respectiveelectrodes were used as a three-layer electrode in which a Ti filmhaving a thickness of 100 nm, an Al film containing Ti and having athickness of 300 nm, and a Ti film having a thickness of 150 nm werecontinuously formed by a sputtering method. Further, a silicon nitrideoxide film 735 having a nitrogen content of from 5 atomic % to 25 atomic% was formed on all surfaces thereof. This film had compressive stress.When a second hydrogenating process was carried out in this state, itwas possible to further improve the characteristics of the TFT. Also inthis step, it was appropriate that a heat treatment at 300 to 450° C.,preferably 300 to 350° C. for 1 to 6 hours was carried out in a hydrogenatmosphere of 1 to 5%. Alternatively, it was possible to makehydrogenating by exposing the whole to hydrogen produced by makingplasma.

[0106] Through the steps described above, the first insulating layer wascomposed of the nitrogen-rich silicon nitride oxide film 702 having thetensile stress and the silicon nitride oxide film 703, and the secondinsulating layer was composed of the gate insulating film 706 made ofthe silicon nitride oxide film, the silicon oxide film 734, and thesilicon nitride oxide film 735. The p-channel TFr was formed in aself-aligning manner, and the n-channel TFT was formed in anonself-aligning manner.

[0107] A channel formation region 742, first impurity regions 745 and746, and second impurity regions 743 and 744 were formed in then-channel TFT of the CMOS circuit. Here, in the second impurity regions,regions (GOLD (gate overlapped drain) regions) 743 a and 744 aoverlapping with the gate electrode, and regions (LDD regions) 743 b and744 b not overlapping with the gate electrode were formed, respectively.The first impurity region 745 became a source region, and the firstimpurity region 746 became a drain region. On the other hand, in thep-channel TFF, a channel formation region 739, and third impurityregions 740 and 741 were formed. The third impurity region 740 became asource region, and the third impurity region 741 became a drain region(FIG. 10B).

[0108]FIG. 10C is a top view showing an inverter circuit. An A-A′sectional structure of a TFT portion, a B-B′ sectional structure of agate wiring portion, and a C-C′ sectional structure of a gate bus lineportion correspond to FIG. 10B. In the present invention, the gateelectrode, the gate wiring, and the gate bus line are formed of thefirst conductive layer. In FIGS. 9A to 9E and FIGS. 10A to 10C, althoughthe CMOS circuit formed by complementarily combining the n-channel TFTand the p-channel TFT is shown as an example, the present invention canalso be applied to an NMOS circuit using an n-charnel TFT, a pixelportion of a liquid crystal display device, an EL display device, areading circuit of an image sensor, and the like.

[0109] [Embodiment 4]

[0110] In this embodiment, a method of fabricating an active matrixsubstrate in which a pixel portion (pixel matrix circuit) and a CMOScircuit as a base of a driver circuit provided at its periphery areformed at the same time will be described with reference to FIGS. 11A to13B.

[0111] First, as a first insulating layer, a nitrogen-rich first siliconnitride oxide film 1102 a was formed to a thickness of 50 to 500 nm,typically 100 nm on a substrate 1101, and further, a second siliconnitride oxide film 1102 b was formed to a thickness of 100 to 500 nm,typically 200 nm. The nitrogen content of the nitrogen-rich firstsilicon nitride oxide film 1102 a was made not less than 25 atomic % andless than 50 atomic %. The nitrogen-rich first silicon nitride oxidefilm 1102 a was formed of SiH₄, N₂O and NH₃, and as shown in FIG. 19,the film had tensile stress. The internal stress was kept even to aheating treatment attendant on a crystallizing step or a gettering step.Further, island-like crystalline semiconductor films 1103, 1104 and1105, and a gate insulating film 1106 were formed. The island-likecrystalline semiconductor films were formed in such a manner that acrystalline semiconductor film was formed from an amorphoussemiconductor film by a crystallizing method using a catalytic element,and this film was processed and separated into island-like regions. Thegate insulating film 1106 was a silicon nitride oxide film formed fromSiH₄ and N₂O, and had compressive stress. Here, the film was formed to athickness of 10 to 200 nm, preferably 50 to 150 nm (FIG. 11A).

[0112] Next, resist masks 1107 to 1111 were formed to cover theisland-like semiconductor film 1103, and channel formation regions ofthe island-like semiconductor films 1104 and 1105. At this time, theresist mask 1109 may be formed in a region where a wiring is formed.Then, an impurity element to give an n-type was added so that secondimpurity regions were formed. Here, phosphorus (P) was added by an iondoping method using phosphine (PH₃). In this step, for the purpose ofadding phosphorus through the gate insulating film 1106 to theisland-like semiconductor film thereunder, the acceleration voltage wasset 65 keV. It is preferable that the concentration of phosphorus addedto the island-like semiconductor is within the range of 1×10¹⁶ to 1×10¹⁹atoms/cm³, and here, it was made 1×10¹⁸ atoms/cm³. Then, regions 1112 to1116 where phosphorus was added were formed. Part of the regions aremade the second impurity regions functioning as LDD regions (FIG. 11B).

[0113] Thereafter, the resist masks were removed and a conductive layer1117 was formed on the whole surface. The conductive layer 1117 isformed by using a conductive material containing an element selectedfrom Ta, Ti, Mo, and W as its main ingredient. It is appropriate thatthe thickness of the conductive layer 1117 is 100 to 1000 nm, preferably150 to 400 nm. Here, the film was formed of Ta by a sputtering methodusing a mixture gas of Ar and Xe (FIG. 11C).

[0114] Next, a gate electrode of a p-channel TFT, gate wirings of a CMOScircuit and a pixel portion, and gate bus lines were formed. Since agate electrode of an n-channel TFT was formed in a subsequent step,resist masks 1119 and 1123 were formed so that the conductive layer 1117remained on the whole surface over the island-like semiconductor film1104. Unnecessary portions of the conductive layer 1117 were removed bya dry etching method. Etching of Ta was carried out by a mixture gas ofCF₄ and O₂. Then, a gate electrode 1124, gate wirings 1126 and 1128, anda gate bus line 1127 were formed. Then, a step of adding a thirdimpurity element to give a p-type was carried out to part of theisland-like semiconductor film 1103 where the p-channel TFT was to beformed, while the resist masks 1118 to 1123 were made to remain as theywere. Here, boron was used as the impurity element and was added by anion doping method using diborane (B₂H₆). Also in this step, theacceleration voltage was made 80 keV, and boron was added at aconcentration of 2×10²⁰ atoms/cm³. As shown in FIG. 12A, third impurityregions 1130 and 1131 where boron was added at the high concentrationwere formed.

[0115] After the resist masks provided in FIG. 12A were removed, resistmasks 1124 to 1130 were newly formed. These were for forming gateelectrodes of n-channel TFTs, and gate electrodes 1131 to 1133 wereformed by adry etching method. At this time, the gate electrodes 1131 to1133 were formed to overlap with part of the second impurity regions1112 to 1116 (FIG. 12B).

[0116] Then, new resist masks 1135 to 1141 were formed. The resist masks1136, 1139, and 1140 were formed into such a shape as to cover the gateelectrodes 1131 to 1133 of the n-channel TFTs and part of the secondimpurity regions. Here, the resist masks 1136, 1139 and 1140 arerespectively for determining an offset amount of LDD regions. Then, astep of forming first impurity regions was carried out by adding animpurity element to give an n-type. Then, first impurity regions 1143and 1144 which became source regions and first impurity regions 1142,1145 and 1146 which became drain regions were formed. Also in this step,phosphorus was added through the gate insulating film 1106 to theisland-like semiconductor film thereunder. The concentration ofphosphorus in this region is high as compared with the step of addingthe first impurity element to give the n-type, and it is preferable thatthe concentration is made 1×10¹⁹ to 1×10²¹ atoms/cm³, and here, it wasmade 1×10²⁰ atoms/cm³. At this time, also in part of the source anddrain regions of the p-channel TFT, regions 1180 and 1181 wherephosphorus was added were formed. However, the concentration ofphosphorus in this region is about half of the concentration of boron,and the conductivity remains the p-type (FIG. 12C).

[0117] After the steps to FIG. 12C were completed, a silicon oxide film1147 was formed. Here, TEOS (Tetraethyl Orthosilicate) was used as a rawmaterial, and the film was formed to a thickness of 1000 nm by a plasmaCVD method. In this state, a heat treatment at 400 to 800° C. for a 1 to24 hours, for example, at 525° C. for 8 hours was carried out. By thisstep, it was possible to activate the added impurity elements to givethe n-type and the p-type. Further, the regions 1142 to 1146, 1180 and1181 where phosphorus was added became gettering sites, so that it waspossible to segregate the catalytic element remaining in the step ofcrystallization into these regions. As a result, it was possible toremove the catalytic element from at least channel formation regions. Itis appropriate that after this heat treatment, a step of hydrogenatingprocess is carried out in a hydrogen atmosphere of 3 to 100% at 150 to500° C., preferably 300 to 450° C. for 2 to 12 hours. Alternatively, thehydrogenating process may be carried out with hydrogen produced bymaking plasma at a substrate temperature of 150 to 500° C., preferably200 to 450° C. In all events, hydrogen compensated defects remaining inthe semiconductor layer or its interface, so that it was possible toimprove the characteristics of the TFT (FIG. 3A).

[0118] Thereafter, the silicon oxide film 1147 was patterned so thatcontact holes reaching a source region and a drain region of each TFTwere formed. Then, source electrodes 1149, 1150 and 1151, and drainelectrodes 1152 and 1153 were formed. Although not shown, in thisembodiment, each of the electrodes was used as a three-layer electrodein which a Ti film having a thickness of 100 nm, an Al film containingTi and having a thickness of 300 nm, and a Ti film having a thickness of150 nm were continuously formed by a sputtering method. When a secondhydrogenating process was carried out in this state, it was possible tofurther improve the characteristics of the TFT. Also in this step, itwas appropriate that a heat treatment at 300 to 450° C., preferably 300to 350° C. for 1 to 6 hours was carried out in a hydrogen atmosphere of1 to 5%. Alternatively, it was possible to carry out hydrogenating byexposing the whole to hydrogen produced by making plasma. Then, asilicon nitride oxide film 1148 was formed to a thickness of 100 to 500nm, for example, 300 nm. The silicon nitride oxide film 1148 was formedby a plasma CVD method, and was formed from a mixture gas of SiH₄, N₂Oand NH₃ based on the data of FIG. 19, so that the nitrogen content inthe film became less than 25 atomic %, and the film had compressivestress (FIG. 13B).

[0119] Through the steps as described above, the first insulating layerwas composed of the nitrogen-rich first silicon nitride oxide film 1102a having the tensile stress and the second silicon nitride oxide film1102 b, and the second insulating layer was composed of the gateinsulating film 1106 made of the silicon nitride oxide film, the siliconoxide film 1147, and the silicon nitride oxide film 1148. The p-channelTFT was formed in a self-aligning manner, and the n-channel TFr wasformed in a nonself-aligning manner.

[0120] Through the foregoing steps, a channel formation region 1157,first impurity regions 1160 and 1161, second impurity regions 1158 and1159 were formed in the n-channel TFT of the CMOS circuit. Here, in thesecond impurity regions, regions (GOLD (gate overlapped drain) regions)1158 a and 1159 a overlapping with the gate electrode and regions (LDDregions) 1158 b and 1159 b not overlapping with the gate electrode wereformed, respectively. The first impurity region 1160 became a sourceregion, and the first impurity region 1161 became a drain region. In thep-channel TFT, a channel formation region 1154, and third impurityregions 1155 and 1156 were formed. The third impurity region 1155 becamea source region, and the third impurity region 1156 became a drainregion. The n-channel TFT (pixel TFT) of the pixel portion had amulti-gate structure, and channel formation regions 1162 and 1163, firstimpurity regions 1168, 1169, and 1145, and second impurity regions 1164to 1167 were formed. Here, in the second impurity regions, regions 1164a, 1165 a, 1166 a and 1167 a overlapping with the gate electrodes, andregions 1164 b, 1165 b, 1166 b, and 1167 b not overlapping with the gateelectrodes were formed.

[0121] In this way, as shown in FIG. 13B, the active matrix substrate inwhich the CMOS circuit and the pixel portion were formed on thesubstrate 1101 was fabricated. At a drain side of the pixel TFT, a lowconcentration impurity region 1170 in which an impurity element to givean n-type was added at the same concentration as the second impurityregion, the gate insulating film 1106, and a holding capacitanceelectrode 1171 were formed, and holding capacitance provided at thepixel portion was formed at the same time.

[0122] [Embodiment 5]

[0123] In this embodiment, steps of fabricating an active matrix typeliquid crystal display device from an active matrix substrate fabricatedin Embodiment 4 will be described with reference to FIGS. 14A and 14B.To the active matrix substrate in the state of FIG. 13B, an interlayerinsulating film 1401 made of an organic resin was formed to a thicknessof about 1000 nm. As the organic resin, polyimide, acryl,polyimidoamide, etc. may be used. As advantages obtained by using theorganic resin film, it is possible to enumerate such points that a filmformation method is simple, parasitic capacitance can be reduced sinceits relative dielectric constant is low, and flatness is superior. Anorganic resin film other than the above may be used. Here, polyimide ofsuch a type that thermal polymerization was made after coating to thesubstrate was used, and was fired at 300° C. to form the film. Theinternal stress of this organic resin film was about 1×10⁸ Pa, and itdid not become a serious problem in considering the stress balance aswas expected from its absolute value. A contact hole reaching the drainelectrode 1153 was formed in the interlayer insulating film 1401, and apixel electrode 1402 was formed. As the pixel electrode 1402, it isappropriate that a transparent conductive film is used in the case wherea transmission type liquid crystal display device is formed, and a metalfilm is used in the case where a reflection type liquid crystal displaydevice is formed. Here, for the purpose of making the transmission typeliquid crystal display device, an indium-tin oxide (ITO) film having athickness of 100 nm was formed by a sputtering method (FIG. 14A)

[0124] Next, as shown in FIG. 14B, an orientation film 1501 was formedon the surfaces of the interlayer insulating film 1401 and the pixelelectrode 1402. In general, polyimide resin is often used for anorientation film of a liquid crystal display device. A transparentelectrode 1503 and an orientation film 1504 were formed on an oppositesubstrate 1502. The orientation film was subjected to a rubbing processafter formation so that liquid crystal molecules were made to beoriented in parallel and with a certain constant pretilt angle. Afterthe foregoing steps, the active matrix substrate on which the pixelportion and the CMOS circuit were formed and the opposite substrate werebonded to each other by a well-known cell assembling step through asealing material, a spacer (both are not shown), and the like.Thereafter, a liquid crystal material 1505 was injected between both thesubstrates, and complete sealing was made by a sealing agent (notshown). Thus, the active matrix type liquid crystal display device shownin FIG. 14B was completed.

[0125] Next, a structure of an active matrix type liquid crystal displaydevice of this embodiment will be described with reference to FIGS. 15,16A, and 16B. FIG. 15 is a perspective view of an active matrixsubstrate of this embodiment. The active matrix substrate is composed ofa pixel portion 1601, a scanning (gate) line driver circuit 1602, and asignal (source) line driver circuit 1603, which are formed on a glasssubstrate 101. A pixel TFT 1600 of the pixel portion is an n-channelTFT, and the driver circuits provided at the periphery are constitutedby a CMOS circuit as a base. The scanning (gate) line driver circuit1602 and the signal (source) line driver circuit 1603 are connected tothe pixel portion 1601 through a gate wiring 1703 and a source wiring1704, respectively.

[0126]FIG. 16A is a top view of the pixel portion 1601 and is a top viewof about one pixel. An n-channel pixel TFT is provided in the pixelportion. A gate electrode 1702 formed to be connected with a gate wiring1703 intersects through a not-shown gate insulating film with asemiconductor layer 1701 under the film. Although not shown, a sourceregion, a drain region, and a first impurity region are formed in thesemiconductor layer. At a drain side of the pixel TFT, a holdingcapacitance 1707 is formed of the semiconductor layer, the gateinsulating film, and an electrode made of the same material as the gateelectrode. A sectional structure along line A-A′ shown in FIG. 16Acorresponds to the sectional view of the pixel portion shown in FIG.14B. On the other hand, in the CMOS circuit shown in FIG. 16B, the gateelectrodes 1124 and 1131 extending from the gate wiring 1126 intersectthrough a not-shown gate insulating film with the semiconductor layers1103 and 1104 under the film. Although not shown, similarly, a sourceregion, a drain region, and LDD regions are formed in the semiconductorlayer of the n-channel TFT. Besides, a source region and a drain regionare formed in the semiconductor layer of the p-channel TFT. Concerningthe positional relation, the sectional structure along line B-B′corresponds to the sectional view of the CMOS portion shown in FIG. 14B.

[0127] In this embodiment, although the pixel TFT 1600 has a double gatestructure, a single gate structure may be adopted, or a multi-gatestructure of a triple gate may be adopted. The structure of the activematrix substrate of the present invention is not limited to thestructure of this embodiment. Since the present invention ischaracterized by the structure of a gate electrode and the structure ofa source region, a drain region and other impurity regions of asemiconductor layer provided through a gate insulating film, otherstructures may be suitably determined by an operator.

[0128] [Embodiment 6]

[0129] In this embodiment, a basic method of fabricating a firstinsulating layer and a semiconductor film as an active layer will bedescribed. In FIGS. 21A to 21C, as a substrate 2101, a glass substrate,a ceramic substrate, a quartz substrate, etc. may be used. Besides, asilicon substrate or a metal substrate typified by stainless steel, eachhaving a surface on which an insulating film such as a silicon oxidefilm or a silicon nitride film is formed, may be used. In the case ofusing a glass substrate, it is desirable to previously carry out a heattreatment at a temperature below a distortion point. For example, in acase of using a #1737 substrate of Corning Inc., it is appropriate thata heat treatment at 500 to 650° C., preferably 595 to 645° C. for 1 to24 hours is carried out in advance.

[0130] A first insulating layer 2102 was formed on the main surface ofthe substrate 2101. Here, a silicon nitride oxide film 2102 a havingtensile stress and a silicon nitride oxide film 2102 b were formed. Anyfilm may be used for the first insulating layer as long as the film hastensile stress, and the first insulating layer may be formed of a layeror plural layers selected from a silicon nitride film, a silicon oxidefilm, a silicon nitride oxide film, and a tantalum oxide film other thanthe former film. These films may be formed by a well-known plasma CVDmethod or a sputtering method. In the case of using the silicon nitrideoxide film, it is appropriate that the film is formed to a thickness of20 to 100 nm, typically 50 nm. A silicon nitride oxide film may beformed to a thickness of 50 to 500 nm, typically 50 to 200 nm on thissilicon nitride film. An amorphous semiconductor layer 2103 was formedon the first insulating layer. This may be an amorphous semiconductorformed by a film growth method such as a plasma CVD method, a lowpressure CVD method or a sputtering method. As the semiconductor,silicon (Si), germanium (Ge), silicon germanium alloy, and siliconcarbide can be enumerated, and in addition, a compound semiconductormaterial such as gallium arsenide may be used. The semiconductor filmwas formed to a thickness of 10 to 100 nm, typically 50 nm. The firstinsulating layer and the amorphous semiconductor layer 2103 can also beformed continuously by a plasma CVD method or a sputtering method. Afterthe respective layers are formed, the surfaces do not come to contactwith the air, so that the pollution of the surfaces can be prevented(FIG. 21A).

[0131] Next, a crystallizing step was carried out. The step ofcrystallizing the amorphous semiconductor layer may use a technique of awell-known laser annealing method or a thermal annealing method. In allevents, as the phase of the semiconductor layer was changed from anamorphous state to a crystalline state, densification and volumecontraction occurred, so that tensile stress was generated in thecrystalline semiconductor layer 2104. Hydrogen at a rate of 10 to 40atomic % was contained in an amorphous semiconductor film fabricated bya plasma CVD method, and it was desirable that a heat treatment at 400to 500° C. was carried out prior to the crystallizing step to removehydrogen from the film so that the hydrogen content was made 5 atomic %or less. When hydrogen was released, tensile stress was generatedconsequently (FIG. 21B).

[0132] A second insulating layer 2105 having compressive stress wasformed to be in contact with the crystalline semiconductor layer 2104.The second insulating layer 2105 may be formed of a layer or plurallayers selected from a silicon nitride film, a silicon oxide film, asilicon nitride oxide film, and a tantalum oxide film. It is appropriatethat the thickness of the second insulating layer 2105 is 10 to 1000 nm,preferably 50 to 400 nm (FIG. 21C).

[0133] It was possible to cause a silicon nitride film, a silicon oxidefilm, a silicon nitride oxide film, and a tantalum oxide film applied tothe first insulating layer 2102 and the second insulating layer 2105 tohave stresses of both states of tensile stress and compressive stressaccording to the fabricating condition. For that purpose, it wassufficient if a mixture ratio of used gases, a substrate temperature atfilm formation, a film formation rate, and the like were suitablydetermined. Such fabricating conditions were different among individualapparatuses to be used. It was also possible to change a film havingcompressive stress to a film having tensile stress by applying a step ofheat treatment. The crystalline semiconductor layer formed from theamorphous semiconductor layer with volume contraction had a tensilestress of 1×10⁸ to 1×10⁹ Pa. To such a crystalline semiconductor layer,it was desirable that a difference in absolute values of internalstresses of the first insulating layer and the second insulating layerwas made 5×10⁹ Pa or less. As described above, when such a structure wasformed that the crystalline semiconductor layer 2104 having tensilestress was provided to be in close contact with the first insulatinglayer 2102 having tensile stress and the second insulating layer 2105having compressive stress, and further, the TFT was fabricated by usinga well-known technique so that the crystalline semiconductor layer 2104became the active layer, it was possible to obtain excellentcharacteristics. At this time, it was preferable that the sum of theinternal stresses of the laminated crystalline semiconductor layer andthe insulating layer was made 1×10⁹ Pa or less in absolute value. Forexample, it was also possible to make the field effect mobility of ann-channel TFT 100 cm²/V·sec or more. It was also possible to improve theresistance against stress due to heat or voltage application.

[0134]FIGS. 22A to 22E show another example, in which a nitrogen-richsilicon nitride oxide film 2202 a having tensile stress and a siliconnitride oxide film 2202 b were formed as a first insulating layer 2202on the main surface of a substrate 2201. Similarly to FIGS. 21A to 21C,an amorphous semiconductor layer 2203 was formed on the surface of thefirst insulating layer. The thickness of the amorphous semiconductorlayer may be 10 to 200 nm, preferably 30 to 100 nm. Further, a solutioncontaining a catalytic element of 10 ppm in terms of weight was appliedby a spin coating method, so that a catalytic element containing layer2204 was formed on the whole surface of the amorphous semiconductorlayer 2203. As the catalytic element usable here, in addition to nickel(Ni), an element such as germanium (Ge), iron (Fe), palladium (Pd), tin(Sn), lead (Pb), cobalt (Co), platinum (Pt), copper (Cu), or gold (Au)may be used. The internal stress of the amorphous semiconductor layerwas not determined uniquely by fabricating conditions. However, when astep of heat treatment at 400 to 600° C. was carried out prior to a stepof crystallization to remove hydrogen from the film, tensile stress wasgenerated. At the same time, since hydrogen was removed also from thefirst insulating layer, the tensile stress was strengthened as well(FIG. 22A).

[0135] Then, a crystallizing step of carrying out a heat treatment at500 to 600° C. for 4 to 12 hours, for example, at 550° C. for 8 hourswas carried out, so that a crystalline semiconductor layer 2205 wasformed (FIG. 22B).

[0136] Next, a step of removing the catalytic element used in thecrystallizing step from the crystalline semiconductor film was carriedout. As a method thereof, this embodiment used a technique disclosed inJapanese Patent Laid-Open No. Hei. 10-247735, No. Hei. 10-135468, or No.Hei. 10-135469. The technique disclosed in the publications is such thata catalytic element is removed by using a gettering function ofphosphorus. By this gettering step, it was possible to reduce theconcentration of the catalytic element in the crystalline semiconductorfilm to 1×10¹⁷ atoms/cm³ or less, preferably 1×10¹⁶ atoms/cm³ or less.First, a mask insulating film 2206 was formed to a thickness of 150 nmon the surface of the crystalline semiconductor layer 2205, and anopening portion 2207 was provided by patterning, so that a region wherethe crystalline semiconductor layer was exposed was provided. Then, astep of adding phosphorus was carried out, so that a phosphoruscontaining region 2208 was provided in the crystalline semiconductorlayer (FIG. 22C).

[0137] In this state, when a heat treatment at 550 to 800° C. for 5 to24 hours, for example, at 600° C. for 12 hours was carried out in anitrogen atmosphere, the phosphorus containing region 2208 functioned asa gettering site, so that it was possible to segregate the catalyticelement remaining in the crystalline silicon layer 2205 into thephosphorus containing region 2208 (FIG. 22D).

[0138] Then, by carrying out etching to remove the mask insulating film2206 and the phosphorus containing region 2208, it was possible toobtain a crystalline semiconductor film in which the concentration ofthe catalytic element used in the step of crystallization was reduced to1×10¹⁷ atoms/cm³ or less. Then, a second insulating layer 2210 havingcompressive stress was formed to be in close contact with thecrystalline semiconductor layer 2209. The second insulating layer 2210may be formed of a layer or plural layers selected from a siliconnitride film, a silicon oxide film, a silicon nitride oxide film, and atantalum oxide film. It is appropriate that the thickness of the secondinsulating layer 2210 is 10 to 1000 nm, preferably 50 to 400 nm (FIG.22E).

[0139] As described above, when such a structure was formed that thecrystalline semiconductor layer 2209 having the tensile stress wasprovided to be in close contact with the first insulating layer 2202having the tensile stress and the second insulating layer 2210 havingthe compressive stress, and then, a TFT including the crystallinesemiconductor layer 2209 as an active layer was fabricated by using awell-known technique, it was possible to obtain excellentcharacteristics. At this time, it was preferable that the sum of theinternal stresses of the laminated crystalline semiconductor layer andthe insulating layer was made 1×10¹⁹ Pa or less in absolute value. Forexample, it was also possible to make the field effect mobility of ann-channel TFT 200 cm²/V·sec or more.

[0140] In FIGS. 23A to 23E, a first insulating layer 2302 having tensilestress, which comprises two films 2302 a and 2302 b, and an amorphoussemiconductor layer 2303 were formed on the main surface of a substrate2301. Then, a mask insulating film 2304 was formed on the surface of theamorphous semiconductor layer 2303. At this time, the thickness of themask insulating film 2304 was set to 150 nm. Further, the maskinsulating film 2304 was patterned to selectively form an openingportion 2305, and then, a solution containing a catalytic element of 10ppm in terms of weight was applied. By this, a catalytic elementcontaining layer 2306 was formed. The catalytic element containing layer2306 was in contact with the amorphous semiconductor layer 2303 at onlythe opening portion 2305 (FIG. 23A).

[0141] Next, a heat treatment at 500 to 650° C. for 4 to 24 hours, forexample, at 500° C. for 14 hours was carried out, so that a crystallinesemiconductor layer 2307 was formed. In the process of thiscrystallization, a region of the amorphous semiconductor layer withwhich the catalytic element was in contact was first crystallized, andcrystal growth progressed in the lateral direction therefrom. The thusformed crystalline semiconductor film 2307 was made of a collective ofrod-like or needle-like crystals, and the respective crystalsmacroscopically grew with certain directionality. Thus, there was anadvantage that crystallinity was uniform (FIG. 23B).

[0142] Next, similarly to FIGS. 22A to 22E, a step of removing thecatalytic element used in the step of crystallization from thecrystalline semiconductor film was carried out. A step of addingphosphorus to the substrate in the same state as FIG. 23B was carriedout, so that a phosphorus containing region 2309 was provided in thecrystalline semiconductor layer. The concentration of phosphorus in thisregion was set to 1×10¹⁹ to 1×10²¹/cm³ (FIG. 23C). In this state, when aheat treatment at 550 to 800° C. for 5 to 24 hours, for example, at 600°C. for 12 hours was carried out in a nitrogen atmosphere, the phosphoruscontaining region 2309 functioned as a gettering site, so that it waspossible to segregate the catalytic element remaining in the crystallinesemiconductor film 2307 into the phosphorus containing region 2309 (FIG.23D).

[0143] Then, the mask insulating film and the phosphorus containingregion 2309 were removed by etching, so that an island-like crystallinesemiconductor layer 2310 was formed. A second insulating layer 2311having compressive stress was formed to be in close contact with thecrystalline semiconductor layer 2310. The second insulating layer 2311was formed of one layer or plural layers selected from a silicon oxidefilm and a silicon nitride oxide film. It is appropriate that thethickness of the second insulating layer 2311 is 10 to 100 nm,preferably 50 to 80 nm. Then, a heat treatment was carried out in anatmosphere containing halogen (typically chlorine) and oxygen. Forexample, the heat treatment was carried out at 950° C. for 30 minutes.Incidentally, it was appropriate that the processing temperature wasselected within the range of 700 to 1100° C., and the processing timewas selected within the range of 10 minutes to 8 hours. As a result, athermal oxidation film was formed at the interface between thecrystalline semiconductor layer 2310 and the second insulating layer2311, so that the volume of the second insulating layer 2311 was furtherincreased, and the compressive stress to the crystalline semiconductorlayer was also further increased (FIG. 23E).

[0144] As described above, when such a structure was formed that thecrystalline semiconductor layer 2310 having the tensile stress wasprovided to be in close contact with the first insulating layer 2302having the tensile stress and the second insulating layer 2311 havingthe compressive stress, and then, a TFT including the crystallinesemiconductor layer 2310 as an active layer was fabricated by using awell-known technique, it was possible to obtain excellentcharacteristics. For example, it was also possible to make the fieldeffect mobility of an n-channel TFT 200 cm²/V·sec or more.

[0145] In FIGS. 24A to 24D, similarly to FIGS. 22A to 22E, after a firstinsulating layer 2402 and a crystalline semiconductor layer 2405 areformed, a catalytic element remaining in the crystalline semiconductorlayer 2405 can also be gettered in a liquid phase. For example,gettering can be made by using sulfuric acid as a solution and bydipping the substrate of the state of FIG. 24B into the sulfuric acidsolution heated at 300 to 500° C. By this method, it was possible toremove the catalytic element remaining in the crystalline semiconductorlayer 2405. In addition, a nitric acid solution, an aqua regia solution,or a tin solution may be used. Thereafter, an island-like semiconductorlayer 2409 and a second insulating layer 2410 were formed.

[0146] [Embodiment 7]

[0147] In this embodiment, semiconductor devices each incorporating anactive matrix type liquid crystal display device with a TFT circuit ofthe present invention will be described with reference to FIGS. 25A to25F, FIGS. 32A to 32C, and FIGS. 33A to 33D.

[0148] As such semiconductor devices, a portable information terminal(an electronic notebook, a mobile computer, a portable telephone, etc.),a video camera, a still camera, a personal computer, a television, andthe like can be enumerated. Examples of those are shown in FIGS. 25A to25F and FIGS. 32A to 32C.

[0149]FIG. 25A shows a portable telephone which is constituted by a mainbody 9001, an audio output portion 9002, an audio input portion 9003, adisplay device 9004, an operation switch 9005, and an antenna 9006. Thepresent invention can be applied to the audio output portion 9002, theaudio input portion 9003, and the display device 9004 provided with anactive matrix substrate.

[0150]FIG. 25B shows a video camera which is constituted by a main body9101, a display device 9102, an audio input portion 9103, an operationswitch 9104, a battery 9105, and an image receiving portion 9106. Thepresent invention can be applied to the audio input portion 9103, thedisplay device 9102 provided with an active matrix substrate, and theimage receiving portion 9106.

[0151]FIG. 25C shows a mobile computer or a portable informationterminal which is constituted by a main body 9201, a camera portion9202, an image receiving portion 9203, an operation switch 9204, and adisplay device 9205. The present invention can be applied to the imagereceiving portion 9203, and the display device 2205 provided with anactive matrix substrate.

[0152]FIG. 25D shows a head mount display which is constituted by a mainbody 9301, a display device 9302, and an arm portion 9303. The presentinvention can be applied to the display device 9302. Although not shown,the present invention can also be used for other signal controllingcircuits.

[0153]FIG. 25E shows a rear type projector which is constituted by amain body 9401, a light source 9402, a display device 9403, apolarization beam splitter 9404, reflectors 9405 and 9406, and a screen9407. The present invention can be applied to the display device 9403.

[0154]FIG. 25F shows an electronic portable book which is constituted bya main body 9501, display devices 9502 and 9503, a storage medium 9504,an operation switch 9505, and an antenna 9506, and is used to displaydata stored in a mini disk (MD) or DVD, or data received by the antenna.The display devices 9502 and 9503 are direct-view display devices, andthe present invention can be applied to the devices.

[0155]FIG. 32A shows a personal computer which is constituted by a mainbody 9601, an image input portion 9602, a display device 9603, and akeyboard 9604.

[0156]FIG. 32B shows a player using a recording medium recording aprogram (hereinafter referred to as a “recording medium”), which isconstituted by a main body 9701, a display device 9702, a speakerportion 9703, a recording medium 9704, and an operation switch 9705.This apparatus uses a DVD (Digital Versatile Disc), CD, or the like asthe recording medium, and appreciation of music, appreciation of movie,a game, or the Internet can be performed.

[0157]FIG. 32C shows a digital camera which is constituted by a mainbody 9801, a display device 9802, an eyepiece portion 9803, an operationswitch 9804, and an image receiving portion (not shown).

[0158]FIG. 33A shows a front type projector which is constituted by adisplay device 3601 and a screen 3602. The present invention can beapplied to the display device and other signal control circuits.

[0159]FIG. 33B shows another rear type projector which is constituted bya main body 3701, a display device 3702, a mirror 3703, and a screen3704. The present invention can be applied to the display device andother signal control circuits.

[0160]FIG. 33C is a view showing an example of structures of the displaydevices 3601 and 3701 in FIG. 33A and FIG. 33B. Each of the displaydevices 3601 and 3702 is constituted by a light source optical system3801, mirrors 3802, 3804 to 3806, a dichroic mirror 3803, a prism 3807,a liquid crystal display device 3808, a phase difference plate 3809, anda projection optical system 3810. The projection optical system 3810 isconstituted by an optical system including a projection lens. Althoughthis embodiment shows an example of a three-plate system, the inventionis not particularly limited to this. For example, a single plate systemmay be used. Besides, in a light path indicated by an arrow in FIG. 33C,an operator may suitably provide an optical system such as an opticallens, a film having a polarizing function, a film for adjusting a phasedifference, and an IR film.

[0161]FIG. 33D is a view showing an example of a structure of the lightsource optical system 3801 in FIG. 33C. In this embodiment, the lightsource optical system 3801 is constituted by a reflector 3811, a lightsource 3812, lens arrays 3813 and 3814, a polarization conversionelement 3815, and a condensing lens 3816. The light source opticalsystem shown in FIG. 33D is merely an example, and the invention is notparticularly limited to this. For example, an operator may suitablyprovide an optical system such as an optical lens, a film having apolarizing function, a film for adjusting a phase difference, and an IRfilm.

[0162] Besides, in addition to the above, the present invention can alsobe applied to an image sensor or an EL display device. Like this, thescope of application of the present invention is extremely wide and thepresent invention can be applied to electronic equipments of any fields.

[0163] [Embodiment 8]

[0164] For the foregoing liquid crystal display device shown in theembodiment 5, various liquid crystals other than a nematic liquidcrystal can be used. For example, it is possible to use a liquid crystaldisclosed in 1998, SID, “Characteristics and Driving Scheme ofPolymer-Stabilized Monostable FLCD Exhibiting Fast Response Time andHigh Contrast Ratio with Gray-Scale Capability” by H. Furue et al.;1997, SID DIGEST, 841, “A Full-Color Thresholdless Antiferroelectric LCDExhibiting Wide Viewing Angle with Fast Response Time” by T. Yoshida etal.; 1996, J. Mater. Chem. 6(4), 671-673, “Thresholdlessantiferroelectricity in liquid crystals and its application to displays”by S. Inui et al.; or U.S. Pat. No. 5,594,569.

[0165]FIG. 26 shows electro-optical characteristics of single stableferroelectric liquid crystal (FLC) in which the ferroelectric liquidcrystal (FLC) exhibiting a transition series of isometricphase—cholesteric phase—chiral smectic C phase is used, transition ofcholesteric phase—chiral smectic C phase is caused while applying a DCvoltage, and a cone edge is made to almost coincide with a rubbingdirection. A display mode by the ferroelectric liquid crystal as shownin FIG. 26 is called a “Half-V-shaped switching mode”. The vertical axisof the graph shown in FIG. 26 indicates transmissivity (in an arbitraryunit) and the horizontal axis indicates applied voltage. The details ofthe “Half-V-shaped switching mode” are described in “Half-V-shapedswitching mode FLCD” by Terada et al., Collection of Preliminary Papersfor 46th Applied Physics Concerned Joint Lecture Meeting, March 1993, p.1316, and “Time-division full-color LCD with ferroelectric liquidcrystal” by Yoshihara et al., Liquid Crystal (Ekisho), Vol. 3, No. 3, p.190.

[0166] As shown in FIG. 26, it is understood that when such aferroelectric mixed liquid crystal is used, low voltage driving andgradation display become possible. For the liquid crystal display deviceof the present invention, it is also possible to use the ferroelectricliquid crystal exhibiting such electro-optical characteristics.

[0167] A liquid crystal exhibiting antiferroelectricity in sometemperature range is called an antiferroelectric liquid crystal (AFLC).In mixed liquid crystals including the antiferroelectric liquid crystal,there is one called a thresholdless antiferroelectric mixed liquidcrystal exhibiting electro-optical response characteristics in whichtransmittance is continuously changed with respect to an electric field.Some thresholdless antiferroelectric mixed liquid crystal exhibits theso-called V-shaped electro-optical response characteristics, and aliquid crystal in which its driving voltage is about ±2.5 V (cellthickness is about 1 μm to 2 μm) has also been found.

[0168] In general, the thresholdless antiferroelectric mixed liquidcrystal has large spontaneous polarization, and the dielectric constantof the liquid crystal itself is high.

[0169] Thus, in the case where the thresholdless antiferroelectric mixedliquid crystal is used for a liquid crystal display device, it becomesnecessary to provide relatively large holding capacitance for a pixel.Thus, it is preferable to use the thresholdless antiferroelectric mixedliquid crystal having small spontaneous polarization.

[0170] Since low voltage driving can be realized by using such athresholdiess antiferroelectric mixed liquid crystal for the liquidcrystal display device of the present invention, low power consumptioncan be realized.

[0171] [Embodiment 9]

[0172] In this embodiment, an example of an active matrix substratedifferent in structure from the embodiment 4 will be described withreference to FIG. 31. First, in accordance with the embodiment 4, stepsfrom FIG. 11A to FIG. 12C are carried out.

[0173] After steps to FIG. 12C were completed, a step of forming firstinterlayer insulating films 3147 and 3148 was carried out. First, thesilicon nitride film 3147 was formed to a thickness of 50 nm. Thesilicon nitride film 3147 was formed by a plasma CVD method, and thefilm formation rate was controlled by changing a high frequency electricpower so that it was possible to give compressive stress. The siliconnitride oxide film 3148 was formed to a thickness of 950 nm from amixture gas of SiH₄ and N₂O.

[0174] Then, a step of heat treatment was carried out. The step of heattreatment was necessary for activating impurity elements added at eachconcentration to give the n-type or p-type. Here, the step of activationwas carried out by a thermal annealing method. The heat treatment wascarried out in a nitrogen atmosphere at 300 to 700° C., preferably 350to 550° C., here, 450° C. for 2 hours.

[0175] Thereafter, the first interlayer insulating films 3147 and 3148were patterned so that contact holes reaching a source region and adrain region of each TFT were formed. Then, source electrodes 3149,3150, and 3151, and drain electrodes 3152 and 3153 were formed. Althoughnot shown, in this embodiment, each of the electrodes was employed as athree-layer electrode in which a Ti film having a thickness of 100 nm,an Al film containing Ti and having a thickness of 300 nm, and a Ti filmhaving a thickness of 150 nm were continuously formed by a sputteringmethod.

[0176] Through the above steps, a channel formation region 3157, firstimpurity regions 3160 and 3161, and second impurity regions 3158 and3159 were formed in the n-channel TFT of the CMOS circuit. Here, in thesecond impurity regions, regions (GOLD regions) 3158 a and 3159 aoverlapping with the gate electrode and regions (LDD regions) 3158 b and3159 b not overlapping with the gate electrode were formed,respectively. The first impurity region 3160 became a source region, andthe first impurity region 3161 became a drain region.

[0177] In the p-channel TFT, a channel formation region 3154, and thirdimpurity regions 3155 and 3156 were formed. The third impurity region3155 became a source region, and the third impurity region 3156 became adrain region.

[0178] The pixel TFT had a multi-gate structure, and channel formationregions 3162 and 3163, first impurity regions 3168, 3169 and 3145, andsecond impurity regions 3164 to 3167 were formed. In the second impurityregions, regions 3164 a, 3165 a, 3166 a, and 3167 a overlapping with thegate electrodes, and regions 3164 b, 3165 b, 3166 b, and 3167 b notoverlapping with the gate electrodes were formed.

[0179] In this way, as shown in FIG. 31, the active matrix substrate inwhich the CMOS circuit and the pixel portion were formed on thesubstrate 3101 was fabricated. At the drain side of the pixel TFr, a lowconcentration impurity region 3170 in which an impurity element to givethe n-type was added at the same concentration as the second impurityregion, a gate insulating film 3106, and a holding capacitance electrode3171 were formed, and a holding capacitance provided in the pixelportion was formed at the same time.

[0180] As in this embodiment, by providing the layer made of the siliconnitride film in the first interlayer insulating films, the compressivestress can be more effectively given. However, since transmittance ofshort wavelength light not longer than 500 nm is lowered in the siliconnitride film, if the film is formed to be excessively thick, thetransmittance is lowered at the pixel portion, which is not preferable.Thus, the silicon nitride film of the first interlayer insulating filmis formed to a thickness of 20 to 100 nm, preferably 30 to 60 nm.

[0181] [Embodiment 10]

[0182] In this embodiment, a description will be made on an example inwhich an EL (electroluminescence) display panel (also called an ELdisplay device) is fabricated by using the present invention. FIG. 27Ais a top view of an EL display panel using the present invention. InFIG. 27A, reference numeral 10 designates a substrate; 11, a pixelportion; 12, a data line side driver circuit; and 13, a scanning lineside driver circuit. The respective driver circuits lead to an FPC 17through wirings 14 to 16 and are connected to an external equipment.

[0183] At this time, a sealing material 19 is provided so as to surroundat least the pixel portion, preferably the driver circuits and the pixelportion. Then, sealing is made by an opposite plate 80. As the oppositeplate 80, a glass plate or a plastic plate may be used. An adhesive 81is further provided at the outside of the sealing material 19, so thatthe substrate 10 and the opposite plate 80 are strongly bonded to eachother, and corrosion of an inside device by intrusion of moisture andthe like from a bonded end surface is prevented. In this way, a sealedspace is formed between the substrate 10 and the opposite plate 80. Atthis time, an EL device is put in such a state that it is completelyenclosed in the sealed space, and it is completely insulated from theouter air. Further, a sealing resin 83 is filled between the substrate10 and the opposite plate 80. As the sealing resin 83, an organic resinmaterial selected from silicone based material, epoxy based material,acryl based material, phenol based material, and the like is used. Thisimproves the effect to prevent deterioration of the EL device due tomoisture or the like.

[0184]FIG. 27B is a view showing a sectional structure of an EL displaypanel of this embodiment. A driver circuit TFT 22 (here, a CMOS circuitin which an n-channel TFT and a p-channel TFT are combined is shown) anda pixel portion TFT 23 (here, only a TFT for controlling current to anEL device is shown) are formed on an under film 21 of a substrate 10. Asthe driver circuit TFT 22, an n-channel TFT or a p-channel TFT for aCMOS circuit shown in FIG. 13B in the embodiment 5 may be used. As thepixel portion TFT 23, a pixel TFT shown in FIG. 13B may be used.

[0185] An interlayer insulating film (flattening film) 26 made of aresin material, and a pixel electrode 27 made of a transparentconductive film electrically connected with a drain of the pixel portionTFT 23 are formed on the driver circuit TFT 22 and the pixel portion TFT23. As the transparent electrode, a compound (called ITO) of indiumoxide and tin oxide or a compound of indium oxide and zinc oxide may beused. After the pixel electrode 27 is formed, an insulating film 28 isformed, and an opening portion is formed on the pixel electrode 27.

[0186] Next, an EL layer 29 is formed. The EL layer 29 may be made of alaminate structure by freely combining well-known EL materials (a holeinjection layer, a hole transport layer, a light emitting layer, anelectron transport layer, or an electron injection layer) or asingle-layer structure. A well-known technique may be used to determinewhat structure is formed. The EL material includes a low molecularmaterial and a high molecular (polymer) material. In the case where thelow molecular material is used, an evaporation method is used. In thecase where the high molecular material is used, it is possible to use asimple method such as a spin coating method, a printing method, or anink jet method.

[0187] In this embodiment, the EL layer is formed by using a shadow maskand by an evaporation method. A light-emitting layer (a redlight-emitting layer, a green light-emitting layer, and a bluelight-emitting layer) capable of emitting light with differentwavelengths is formed for every pixel by using the shadow mask, so thatcolor display becomes possible. In addition to that, there are a systemin which a color conversion layer (CCM) and a color filter are combined,and a system in which a white light-emitting layer and a color filterare combined, and any of the methods may be used. Of course, an ELdisplay device of monochromatic emission of light may be made.

[0188] After the EL layer 29 is formed, a cathode 30 is formed thereon.It is desirable that moisture and oxygen existing at the interfacebetween the cathode 30 and the EL layer 29 is removed to the utmostdegree. Thus, such contrivance is necessary that the EL layer 29 and thecathode 30 are continuously formed in vacuum, or the EL layer 29 isformed in an inert gas atmosphere and the cathode 30 is formed withoutopening to the air. In this embodiment, a multi-chamber system (clustertool system) film forming apparatus is used so that the foregoing filmformation is made possible.

[0189] In this embodiment, a laminate structure of a LiF (lithiumfluoride) film and an Al (aluminum) film is used for the cathode 30.Specifically, a LiF (lithium fluoride) film having a thickness of 1 nmis formed on the EL layer 29 by an evaporation method, and an aluminumfilm having a thickness of 300 nm is formed thereon. Of course, a MgAgelectrode of a well-known cathode material may be used. The cathode 30is connected to the wiring 16 in a region designated by 31. The wiring16 is a power source supply line for supplying a predetermined voltageto the cathode 30, and is connected to the FPC 17 through a conductivepaste material 32.

[0190] For the purpose of electrically connecting the cathode 30 to thewiring 16 in the region 31, it is necessary to form a contact hole inthe interlayer insulating film 26 and the insulating film 28. This maybe formed at the time of etching of the interlayer insulating film 26(at the time of formation of the contact hole for the pixel electrode)and at the time of etching of the insulating film 28 (at the time offormation of the opening portion prior to the formation of the ELlayer). Besides, when the insulating film 28 is etched, the interlayerinsulating film 26 may also be etched at the same time. In this case, ifthe interlayer insulating film 26 and the insulating film 28 are made ofthe same resin material, the shape of the contact hole can be madeexcellent.

[0191] The wiring 16 is electrically connected to the FPC 17 through thegap (it is filled with the adhesive 81) between the sealing material 19and the substrate 10. Although the description has been made on thewiring 16, the other wirings 14 and 15 are also electrically connectedto the FPC 17 through the portion under the sealing material 19 in thesame manner.

[0192] In the EL display panel having the structure as described above,the present invention can be used. Here, an example of a more detailedsectional structure of a pixel portion is shown in FIG. 28A, a topstructure is shown in FIG. 29A, and a circuit diagram is shown in FIG.29B. Since common reference numerals are used in FIGS. 28A, 29A, and29B, they may be referred to one another. Incidentally, FIGS. 28A, 29A,and 29B merely show an example of a pixel portion, and it is needless tosay that the present invention is not limited to the structure.

[0193] In FIG. 28A, a switching TFT 2402 provided on a substrate 2401 isformed using an n-channel TFT of the present invention (for example, aTFT of Embodiment Mode 1 shown in FIGS. 1A to 1C). Although thisembodiment adopts a double gate structure, since a large difference doesnot exist in structure and fabricating process, the explanation isomitted. However, by making the double gate structure, such a structureis formed that two TFTs are substantially connected in series to eachother. Thus, there is a merit that an off current value can be reduced.Although the double gate structure is adopted in this embodiment, asingle gate structure may be adopted, or a triple gate structure or amulti-gate structure having more gates may be adopted. Alternatively,the TFT may be formed of a p-channel TFT of the present invention.

[0194] A current controlling TFT 2403 is formed using an n-channel TFTof the present invention. At this time, a drain wiring 35 of theswitching TFT 2402 is electrically connected to a gate electrode 37 ofthe current controlling TFT. A wiring designated by 38 is a gate wiringto electrically connect gate electrodes 39 a and 39 b of the switchingTFT 2402.

[0195] If characteristics of the current controlling TFT 2403, such as athreshold voltage, on current, and subthreshold constant (S value),fluctuate for every pixel, the intensity of light emission of the ELdevice driven by current control fluctuates, and a disturbance occurs inimage display. In order to decrease the fluctuation and to cause thethreshold voltage and the like to be put within a predetermined range,it becomes necessary to use a TFT structure in which the stress balanceis taken into consideration as in the present invention. Since thecurrent controlling TFT is a device to control the amount of currentflowing through the EL device, it is also such a device that a largecurrent flows, so that there is a high possibility of occurrence ofdeterioration due to heat or deterioration due to hot carriers. Thus, itbecomes necessary to make such a structure that an LDD region isprovided at a drain side of the current controlling TFT so as to overlapwith a gate electrode through a gate insulating film.

[0196] In this embodiment, although the current controlling TFT 2403 isshown as a single gate structure, a multi-gate structure in which aplurality of TFTs are connected in series with each other may beadopted. Further, such a structure may be adopted that a plurality ofTFTs are connected in parallel with each other to substantially divide achannel formation region into plural regions, so that radiation of heatcan be made at high efficiency. Such structure is effective as acountermeasure against deterioration due to heat. Like this, in theactive matrix type EL display device, when the TFT described in theembodiment 3, embodiment 4, or embodiment 9 is used, excellentcharacteristics can be obtained. Alternatively, although not shown, theTFT of the inverted stagger type shown in the embodiment 1 or theembodiment 2 may be applied to the active matrix type EL display deviceof this embodiment.

[0197] Besides, as shown in FIG. 29A, a wiring which becomes the gateelectrode 37 of the current controlling TFT 2403 is a region designatedby 2404, and overlaps with a drain wiring 40 of the current controllingTFT 2403 through an insulating film. At this time, in the regiondesignated by 2404, a capacitor is formed. This capacitor 2404 functionsas a capacitor for holding a voltage applied to the gate of the currentcontrolling TFT 2403. Note that a drain wiring is connected to a currentsupply line (power source line) 2501, and is always applied with aconstant voltage.

[0198] A first passivation film 41 is provided on the switching TFT 2402and the current controlling TFT 2403, and a flattening film 42 made of aresin insulating film is formed thereon. It is very important to flattena step due to the TFT by using the flattening film 42. Since asubsequently formed EL layer is very thin, there is a case where poorlight emission occurs due to the existence of the step. Thus, it isdesirable to make flattening prior to formation of a pixel electrode sothat the EL layer can be formed on the flattest possible surface.

[0199] Reference numeral 43 designates a pixel electrode (cathode of theEL device) made of a conductive film having high reflectivity, which iselectrically connected to the drain of the current controlling TFT 2403.As the pixel electrode 43, it is preferable to use a low resistanceconductive film such as an aluminum alloy film, a copper alloy film, ora silver alloy film, or a laminate film of those. Of course, a laminatestructure to other conductive films may be adopted.

[0200] A light emitting layer 44 is formed in a groove (corresponding toa pixel) formed of banks 44 a and 44 b made of insulating films(preferably, resin). Although only one pixel is shown here, lightemitting layers corresponding to the respective colors of R (Red), G(Green) and B (Blue) may be separately formed. As an organic EL materialthat constitutes a light emitting layer, π conjugated polymer materialis used. As typical polymer materials, polyparaphenylene vinylene (PPV),polyvinylcarbazole (PVK), polyfluorene, and the like can be enumerated.Although various types exist for the PPV organic EL materials, forexample, a material disclosed in “H. Shenk, H. Becker, O. Gelsen, E.Kluge, W. Kreuder, and H. Spreitzer, “Polymers for Light EmittingDiodes”, Euro Display, Proceedings, 1999, p.33-37”, or Japanese PatentLaid-Open No. Hei. 10-92576 may be used.

[0201] As a specific light emitting layer, it is appropriate thatcyanopolyphenylene vinylene is used for a light emitting layer emittinga red light, polyphenylene vinylene is used for a light emitting layeremitting a green light, and polyphenylene vinylene or polyalkylphenyleneis used for a light emitting layer emitting a blue light. It isappropriate that the film thickness is made 30 to 150 nm (preferably 40to 100 nm). However, the above examples are only examples of organic ELmaterials capable of being used for the light emitting layer, and it isnot necessary to limit the invention to those. The EL layer (layer inwhich light emission is made and carrier movement for that is made) maybe formed by freely combining a light emitting layer, a charge transportlayer, and a charge injection layer.

[0202] For example, although this embodiment shows an example in which apolymer material is used for the light emitting layer, a low molecularorganic EL material may be used. It is also possible to use an inorganicresin material such as silicon carbide for the charge transport layer orthe charge injection layer. As the organic EL material and the inorganicmaterial, well-known materials can be used.

[0203] In this embodiment, the EL layer is made to have such a laminatestructure that a hole injection layer 46 made of PEDOT (polythiophene)or PAni (polyaniline) is provided on a light emitting layer 45. An anode47 made of a transparent conductive film is provided on the holeinjection layer 46. In the case of this embodiment, since light producedin the light emitting layer 45 is emitted toward the upper surface side(toward a portion above the TFT), the anode must be translucent. As thetransparent conductive film, although a compound of indium oxide and tinoxide or a compound of indium oxide and zinc oxide may be used, since itis formed after the light emitting layer and the hole injection layerhaving low heat resistance are formed, it is preferable that thetransparent conductive film can be formed at the lowest possibletemperature.

[0204] At the point when the anode 47 has been formed, an EL device 2405is completed. Note that the EL device here indicates the pixel electrode(cathode) 43, the light emitting layer 45, the hole injection layer 46,and the capacitor formed at the anode 47. As shown in FIG. 29A, sincethe pixel electrode 43 roughly coincides with the area of a pixel, thewhole pixel functions as the EL device. Thus, a usage efficiency oflight emission is very high, and bright image display becomes possible.

[0205] In this embodiment, a second passivation film 48 is furtherprovided on the anode 47. As the second passivation film 48, a siliconnitride film or a silicon nitride oxide film is preferable. This objectis to isolate the EL device from the outside, which has both of ameaning to prevent deterioration due to oxidation of the organic ELmaterial and a meaning to prevent degassing from the organic ELmaterial. By this, the reliability of the EL display device can beraised.

[0206] As described above, the EL display panel of the present inventionincludes the pixel portion made of a pixel having the structure as shownin FIG. 28A, and includes the switching TFT which has a sufficiently lowoff current value and the current control ling TFT which is strongagainst hot carrier injection. Thus, the EL display panel having highreliability and enabling excellent image display can be obtained.Incidentally, in the structure of this embodiment, it is effective touse the EL display panel of this embodiment as the display portion ofthe electronic equipment of the embodiment 7.

[0207] [Embodiment 11]

[0208] In this embodiment, a description will be made on a structure inwhich the structure of the EL device 2405 in the pixel portion shown inthe embodiment 10 is inverted. FIG. 28B is used for the description.Incidentally, since different points from the structure of FIG. 28A areonly a portion of an EL device and a current controlling TFT, thedescription of other portions is omitted.

[0209] In FIG. 28B, a current controlling TFT 2601 is formed by using ap-channel TFT of the present invention. Embodiments 3, 4 and 9 may bereferred to for fabricating steps. In this embodiment, a transparentconductive film is used as a pixel electrode (anode) 50. Specifically, aconductive film made of a compound of indium oxide and zinc oxide isused. Of course, a conductive film made of a compound of indium oxideand tin oxide may be used.

[0210] After banks 51 a and 51 b made of an insulating film are formed,a light emitting layer 52 made of polyvinylcarbazole is formed byapplication of a solution. An electron injection layer 53 made ofpotassium acetylacetonate and a cathode 54 made of aluminum alloy areformed thereon. In this case, the cathode 54 functions also as apassivation film. In this way, an EL device 2602 is formed.

[0211] In the case of this embodiment, light generated in the lightemitting layer 53 is emitted as indicated by an arrow toward thesubstrate on which TFTs are formed. In the case where the structure ofthis embodiment is adopted, it is preferable that the currentcontrolling TFT 2601 is formed of a p-channel TFT. Incidentally, thestructure of this embodiment can be freely combined with the structureof the embodiments 1 to 4 and 9. It is effective to use the EL displaypanel of this embodiment as the display portion of the electronicequipment of the embodiment 7.

[0212] [Embodiment 12]

[0213] In this embodiment, an example of a pixel having a structuredifferent from the circuit diagram shown in FIG. 29B will be describedwith reference to FIGS. 30A to 30C. In this embodiment, referencenumeral 2701 designates a source wiring of a switching TFT 2702; 2703, agate wiring of the switching TFT 2702; 2704, a current controlling TFT;2705, a capacitor; 2706, 2708, current supply lines; and 2707, an ELdevice.

[0214]FIG. 30A shows an example of a case where a current supply line2706 is common to two pixels. That is, this example is characterized inthat two pixels are formed axisymmetrically with respect to the currentsupply line 2706. In this case, since the number of power supply linescan be reduced, the pixel portion can be further made fine.

[0215]FIG. 30B shows an example of a case where a current supply line2708 is provided in parallel with a gate wiring 2703. Although FIG. 30Bshows a structure in which the current supply line 2708 and the gatewiring 2703 are provided so that they do not overlap with each other, ifboth are wirings formed in different layers, it is also possible toprovide them so that they overlap with each other through an insulatingfilm. In this case, since an occupied area can be made common to thepower supply line 2708 and the gate wiring 2703, the pixel portion canbe made further fine.

[0216]FIG. 30C shows an example characterized in that a current supplyline 2708 is provided in parallel with gate wirings 2703 a and 2703 bsimilarly to the structure of FIG. 30B, and further, two pixels areformed to become axisymmetric with respect to the current supply line2708. It is also effective to provide the current supply line 2708 insuch a manner that it overlaps with either one of the gate wirings 2703a and 2703 b. In this case, since the number of power supply lines canbe reduced, the pixel portion can be made further fine. Incidentally,the structure of this embodiment can be freely combined with thestructure of the embodiment 10 or 11. It is effective to use the ELdisplay panel having the pixel structure of this embodiment as thedisplay portion of the electronic equipment of the embodiment 7.

[0217] [Embodiment 13]

[0218] Although the embodiment 10 shown in FIGS. 29A and 29B has such astructure that the capacitor 2404 for holding a voltage applied to thegate of the current controlling TFT 2403 is provided, the capacitor 2404can be omitted.

[0219] In the case of the embodiment 10, since the n-channel TFT of thepresent invention as shown in FIG. 28A is used for the currentcontrolling TFT 2403, the TFT includes an LDD region provided to overlapwith a gate electrode through a gate insulating film. Although parasiticcapacitance generally called gate capacitance is formed in thisoverlapping region, this embodiment is characterized in that thisparasitic capacitance is positively used as a substitution of thecapacitor 2404.

[0220] Since the capacitance of this parasitic capacitance is changed byan area where the gate electrode overlaps with the LDD region, it isdetermined by the length of the LDD region contained in the overlappingregion. Also in the structures of FIGS. 30A, 30B and 30C, the capacitor2705 can be omitted similarly. Incidentally, the structure of thisembodiment can be freely combined with the structure of the embodiments1 to 4 and 9. It is effective to use the EL display panel having thepixel structure of this embodiment as the display portion of theelectronic equipment of the embodiment 7.

[0221] As described above, in a semiconductor device including an activelayer of a semiconductor film formed on a substrate, stress balance isconsidered among the semiconductor film, a first insulating layerprovided at a substrate side with respect to the semiconductor film, anda second insulating layer provided at a side opposite to the substrateside, so that it is possible to decrease distortion in the active layerand at the interface between the active layer and the insulating layer,or generation of defects. As a result, a high field effect mobility canbe obtained, and by improving resistance against stress due to heat oran electric field, a semiconductor device with high reliability can berealized.

What is claimed is:
 1. A semiconductor device comprising: asemiconductor island being formed as an active layer over a substrate; afirst insulating layer being formed between the substrate and the activelayer, said first insulating layer including: a first silicon nitrideoxide film having a first nitrogen concentration higher than a firstoxygen concentration, and a second silicon nitride oxide film having asecond nitrogen concentration lower than a second oxygen content; and asecond insulating layer being formed in contact with a surface of theactive layer at an opposite side to the substrate, said secondinsulating layer including: a plurality of third silicon nitride oxidefilms each having a third nitrogen concentration lower than a thirdoxygen concentration.
 2. A device according to claim 1, wherein theactive layer has a tensile stress, wherein the first silicon nitrideoxide film of the first insulating film has a tensile stress, andwherein each of the plurality of third silicon nitride oxide films ofthe second insulating layer has a compressive stress.
 3. A deviceaccording to claim 1, wherein the first nitrogen concentration of thefirst silicon nitride oxide film is not less than 25 atomic % and lessthan 50 atomic %, and wherein the third nitrogen concentration of eachof the third silicon nitride oxide films is not less than 5 atomic % andless than 25 atomic %.
 4. A semiconductor device comprising: asemiconductor island being formed as an active layer over a substrate; afirst insulating layer being formed between the substrate and the activelayer and including a first plurality of insulating films; and a secondinsulating layer being formed in contact with a surface of the activelayer at an opposite side to the substrate and including a secondplurality of insulating films; wherein the active layer has a tensilestress, and wherein at least one of the first plurality of insulatingfilms of the first insulating layer has a tensile stress.
 5. Asemiconductor device comprising: a semiconductor island being formed asan active layer over a substrate; a first insulating layer being formedbetween the substrate and the active layer and including a firstplurality of insulating films; and a second insulating layer beingformed in contact with a surface of the active layer at an opposite sideto the substrate side and including a second plurality of insulatingfilms; wherein the active layer has a tensile stress, and wherein atleast one of the second plurality of insulating films of the secondinsulating layer has a compressive stress.
 6. A semiconductor devicecomprising: a semiconductor island being formed as an active layer overa substrate; a first insulating layer being formed between the substrateand the active layer and including a first plurality of insulatingfilms; and a second insulating layer being formed in contact with asurface of the active layer at an opposite side to the substrate andincluding a second plurality of insulating films; wherein the activelayer has a tensile stress, wherein at least one of the first pluralityof insulating film of the first insulating layer has a tensile stress,and wherein at least one of the second plurality of insulating film ofthe second insulating layer has a compressive stress.
 7. A semiconductordevice comprising: a semiconductor island being formed as an activelayer over a substrate; a first insulating layer being formed betweenthe substrate and the active layer and including a first plurality ofinsulating films; an electrode for applying a voltage to the activelayer through the first insulating layer; and a second insulating layerbeing formed in contact with a surface of the active layer at anopposite side to the substrate and including a second plurality ofinsulating films; wherein the active layer has a tensile stress, whereinat least one of the first plurality of insulating films of the firstinsulating layer has a tensile stress, and wherein at least one of thesecond plurality of insulating films of the second insulating layer hasa compressive stress.
 8. A semiconductor device comprising: asemiconductor island being formed as an active layer over a substrate; afirst insulating layer being formed between the substrate and the activelayer and including a first plurality of insulating films; a secondinsulating layer being formed in contact with a surface of the activelayer at an opposite side to the substrate including a second pluralityof insulating films; an insulating film of the second insulating layerbeing in contact with the active layer; and an electrode for applying avoltage to the active layer through the insulating film of the secondinsulating layer; wherein the active layer has a tensile stress, whereinat least one of the first plurality of insulating films of the firstinsulating layer has a tensile stress, and wherein at least one of thesecond plurality of insulating films of the second insulating layer hasa compressive stress.
 9. A semiconductor device comprising at least athin film transistor, said thin film transistor including: a firstsilicon nitride oxide film including nitrogen at a first concentrationand being formed on an insulating surface; a second silicon nitrideoxide film including nitrogen at a second concentration and being formedon the first silicon nitride oxide film; a crystalline semiconductorisland being formed on the second silicon nitride oxide film; a gateinsulating film comprising a third silicon nitride oxide film includingnitrogen at a third concentration and being formed on the crystallinesemiconductor island; a gate electrode being formed over the crystallinesemiconductor island with the gate insulating film therebetween; aninterlayer insulating film being formed on the gate electrode and thegate insulating film, wherein the first concentration is higher thaneach of the second and third concentrations, wherein the first siliconnitride oxide film has a tensile stress while each of the second siliconnitride oxide film and the interlayer insulating film has a compressivestress.
 10. A device according to claim 4, wherein the first insulatinglayer comprises at least one selected from the group consisting of asilicon nitride film, a silicon oxide film, a silicon nitride oxidefilm, and a tantalum oxide film.
 11. A device according to claim 4,wherein the second insulating layer comprises at least one selected fromthe group consisting of a silicon nitride film, a silicon oxide film, asilicon nitride oxide film, and a tantalum oxide film.
 12. A deviceaccording to claim 1, wherein the semiconductor device is one selectedfrom the group consisting of a liquid crystal display device, an ELdisplay device, and an image sensor.
 13. A device according to claim 1,wherein the semiconductor device is one selected from the groupconsisting of a portable telephone, a video camera, a portableinformation terminal, a head mount display, a projector, an electronicportable book, a personal computer, a DVD player, and a digital camera.14. A method of fabricating a semiconductor device, said methodcomprising the steps of: forming a semiconductor island having a tensilestress as an active layer over a substrate; forming a first insulatinglayer having a tensile stress between the substrate and the activelayer; and forming a second insulating layer having a compressive stressat an opposite side to the substrate of the active layer.
 15. A methodof fabricating a semiconductor device, said method comprising the stepsof: forming a semiconductor film over a substrate; forming a firstinsulating layer between the substrate and the semiconductor film;providing a tensile stress to the first insulating layer and thesemiconductor film by a heat treatment; forming a semiconductor islandas an active layer by separating the semiconductor film; and forming asecond insulating layer having a compressive stress at an opposite sideto the substrate of the active layer.
 16. A method of fabricating asemiconductor device, said method comprising the steps of: forming asemiconductor island having a tensile stress as an active layer over asubstrate; forming a first insulating layer having a tensile stressbetween the substrate and the active layer; forming a second insulatinglayer having a compressive stress at an opposite side to the substrateof the active layer; and forming an electrode for applying a voltage tothe active layer through the second insulating layer.
 17. A method offabricating a semiconductor device, said method comprising the steps of:forming a semiconductor island having a tensile stress as an activelayer over a substrate; forming an electrode for applying a voltage tothe active layer through a first insulating layer; forming the firstinsulating layer having a tensile stress between the substrate and theactive layer; and forming a second insulating layer having a compressivestress at an opposite to the substrate of the active layer.
 18. A methodof fabricating a semiconductor device including a thin film transistor,said method comprising the steps of: forming a first silicon nitrideoxide film including nitrogen at a first concentration on an insulatingsurface; forming a second silicon nitride oxide film including nitrogenat a second concentration on the first silicon nitride oxide film;forming a crystalline semiconductor island on the second silicon nitrideoxide film; forming a gate insulating film comprising a third siliconnitride oxide film including nitrogen at a third concentration on thecrystalline semiconductor island; forming a gate electrode over thecrystalline semiconductor island with the gate insulating filmtherebetween; forming an interlayer insulating film on the gateelectrode and the gate insulating film, wherein the first concentrationis higher than each of the second and third concentrations, wherein thefirst silicon nitride oxide film has a tensile stress while each of thesecond silicon nitride oxide film and the interlayer insulating film hasa compressive stress.
 19. A method according to claim 14, wherein thefirst insulating layer includes a first silicon nitride oxide filmhaving a nitrogen concentration of not less than 25 atomic % and lessthan 50 atomic %, and the second insulating layer includes a secondsilicon nitride oxide film having a nitrogen concentration of not lessthan 5 atomic % and less than 25 atomic %.
 20. A method according toclaim 14, wherein the first insulating layer comprises at least oneselected from the group consisting of a silicon nitride film, a siliconoxide film, a silicon nitride oxide film, and a tantalum oxide film. 21.A method according to claim 14, wherein the second insulating layercomprises at least one selected from the group consisting of a siliconnitride film, a silicon oxide film, a silicon nitride oxide film, and atantalum oxide film.
 22. A method according to claim 14, wherein thesemiconductor device is one selected from the group consisting of aliquid crystal display device, an EL display device, and an imagesensor.
 23. A method according to claim 14, wherein the semiconductordevice is one selected from the group consisting of a portabletelephone, a video camera, a portable information terminal, a head mountdisplay, a projector, an electronic portable book, a personal computer,a DVD player, and a digital camera.
 24. A device according to claim 4,wherein the semiconductor device is one selected from the groupconsisting of a liquid crystal display device, an EL display device, andan image sensor.
 25. A device according to claim 4, wherein thesemiconductor device is one selected from the group consisting of aportable telephone, a video camera, a portable information terminal, ahead mount display, a projector, an electronic portable book, a personalcomputer, a DVD player, and a digital camera.
 26. A device according toclaim 5, wherein the first insulating layer comprises at least oneselected from the group consisting of a silicon nitride film, a siliconoxide film, a silicon nitride oxide film, and a tantalum oxide film. 27.A device according to claim 5, wherein the second insulating layercomprises at least one selected from the group consisting of a siliconnitride film, a silicon oxide film, a silicon nitride oxide film, and atantalum oxide film.
 28. A device according to claim 5, wherein thesemiconductor device is one selected from the group consisting of aliquid crystal display device, an EL display device, and an imagesensor.
 29. A device according to claim 5, wherein the semiconductordevice is one selected from the group consisting of a portabletelephone, a video camera, a portable information terminal, a head mountdisplay, a projector, an electronic portable book, a personal computer,a DVD player, and a digital camera.
 30. A device according to claim 6,wherein the first insulating layer comprises at least one selected fromthe group consisting of a silicon nitride film, a silicon oxide film, asilicon nitride oxide film, and a tantalum oxide film.
 31. A deviceaccording to claim 6, wherein the second insulating layer comprises atleast one selected from the group consisting of a silicon nitride film,a silicon oxide film, a silicon nitride oxide film, and a tantalum oxidefilm.
 32. A device according to claim 6, wherein the semiconductordevice is one selected from the group consisting of a liquid crystaldisplay device, an EL display device, and an image sensor.
 33. A deviceaccording to claim 6, wherein the semiconductor device is one selectedfrom the group consisting of a portable telephone, a video camera, aportable information terminal, a head mount display, a projector, anelectronic portable book, a personal computer, a DVD player, and adigital camera.
 34. A device according to claim 7, wherein the firstinsulating layer comprises at least one selected from the groupconsisting of a silicon nitride film, a silicon oxide film, a siliconnitride oxide film, and a tantalum oxide film.
 35. A device according toclaim 7, wherein the second insulating layer comprises at least oneselected from the group consisting of a silicon nitride film, a siliconoxide film, a silicon nitride oxide film, and a tantalum oxide film. 36.A device according to claim 7, wherein the semiconductor device is oneselected from the group consisting of a liquid crystal display device,an EL display device, and an image sensor.
 37. A device according toclaim 7, wherein the semiconductor device is one selected from the groupconsisting of a portable telephone, a video camera, a portableinformation terminal, a head mount display, a projector, an electronicportable book, a personal computer, a DVD player, and a digital camera.38. A device according to claim 8, wherein the first insulating layercomprises at least one selected from the group consisting of a siliconnitride film, a silicon oxide film, a silicon nitride oxide film, and atantalum oxide film.
 39. A device according to claim 8, wherein thesecond insulating layer comprises at least one selected from the groupconsisting of a silicon nitride film, a silicon oxide film, a siliconnitride oxide film, and a tantalum oxide film.
 40. A device according toclaim 8, wherein the semiconductor device is one selected from the groupconsisting of a liquid crystal display device, an EL display device, andan image sensor.
 41. A device according to claim 8, wherein thesemiconductor device is one selected from the group consisting of aportable telephone, a video camera, a portable information terminal, ahead mount display, a projector, an electronic portable book, a personalcomputer, a DVD player, and a digital camera.
 42. A device according toclaim 9, wherein the semiconductor device is one selected from the groupconsisting of a liquid crystal display device, an EL display device, andan image sensor.
 43. A device according to claim 9, wherein thesemiconductor device is one selected from the group consisting of aportable telephone, a video camera, a portable information terminal, ahead mount display, a projector, an electronic portable book, a personalcomputer, a DVD player, and a digital camera.
 44. A device according toclaim 9, wherein the first concentration is not less than 25 atomic %and less than 50 atomic %, while each of the second and thirdconcentration is not less than 5 atomic % and less than 25 atomic %. 45.A device according to claim 9, wherein the semiconductor island includesa source region, a drain region, a channel region and a pair of LDDregions, wherein each of the LDD regions includes a first portion whichis overlapped with the gate electrode with the gate insulating filmtherebetween and a second portion which is not overlapped with the gateelectrode.
 46. A method according to claim 15, wherein the firstinsulating layer includes a first silicon nitride oxide film having anitrogen concentration of not less than 25 atomic % and less than 50atomic %, and the second insulating layer includes a second siliconnitride oxide film having a nitrogen concentration of not less than 5atomic % and less than 25 atomic %.
 47. A method according to claim 15,wherein the first insulating layer comprises at least one selected fromthe group consisting of a silicon nitride film, a silicon oxide film, asilicon nitride oxide film, and a tantalum oxide film.
 48. A methodaccording to claim 15, wherein the second insulating layer comprises atleast one selected from the group consisting of a silicon nitride film,a silicon oxide film, a silicon nitride oxide film, and a tantalum oxidefilm.
 49. A method according to claim 15, wherein the semiconductordevice is one selected from the group consisting of a liquid crystaldisplay device, an EL display device, and an image sensor.
 50. A methodaccording to claim 15, wherein the semiconductor device is one selectedfrom the group consisting of a portable telephone, a video camera, aportable information terminal, a head mount display, a projector, anelectronic portable book, a personal computer, a DVD player, and adigital camera.
 51. A method according to claim 16, wherein the firstinsulating layer includes a first silicon nitride oxide film having anitrogen concentration of not less than 25 atomic % and less than 50atomic %, and the second insulating layer includes a second siliconnitride oxide film having a nitrogen concentration of not less than 5atomic % and less than 25 atomic %.
 52. A method according to claim 16,wherein the first insulating layer comprises at least one selected fromthe group consisting of a silicon nitride film, a silicon oxide film, asilicon nitride oxide film, and a tantalum oxide film.
 53. A methodaccording to claim 16, wherein the second insulating layer comprises atleast one selected from the group consisting of a silicon nitride film,a silicon oxide film, a silicon nitride oxide film, and a tantalum oxidefilm.
 54. A method according to claim 16, wherein the semiconductordevice is one selected from the group consisting of a liquid crystaldisplay device, an EL display device, and an image sensor.
 55. A methodaccording to claim 16, wherein the semiconductor device is one selectedfrom the group consisting of a portable telephone, a video camera, aportable information terminal, a head mount display, a projector, anelectronic portable book, a personal computer, a DVD player, and adigital camera.
 56. A method according to claim 17, wherein the firstinsulating layer includes a first silicon nitride oxide film having anitrogen concentration of not less than 25 atomic % and less than 50atomic %, and the second insulating layer includes a second siliconnitride oxide film having a nitrogen concentration of not less than 5atomic % and less than 25 atomic %.
 57. A method according to claim 17,wherein the first insulating layer comprises at least one selected fromthe group consisting of a silicon nitride film, a silicon oxide film, asilicon nitride oxide film, and a tantalum oxide film.
 58. A methodaccording to claim 17, wherein the second insulating layer comprises atleast one selected from the group consisting of a silicon nitride film,a silicon oxide film, a silicon nitride oxide film, and a tantalum oxidefilm.
 59. A method according to claim 17, wherein the semiconductordevice is one selected from the group consisting of a liquid crystaldisplay device, an EL display device, and an image sensor.
 60. A methodaccording to claim 17, wherein the semiconductor device is one selectedfrom the group consisting of a portable telephone, a video camera, aportable information terminal, a head mount display, a projector, anelectronic portable book, a personal computer, a DVD player, and adigital camera.
 61. A method according to claim 18, wherein the firstconcentration is not less than 25 atomic % and less than 50 atomic %,while each of the second and third concentration is not less than 5atomic % and less than 25 atomic %.
 62. A method according to claim 18,wherein the semiconductor device is one selected from the groupconsisting of a liquid crystal display device, an EL display device, andan image sensor.
 63. A method according to claim 18, wherein thesemiconductor device is one selected from the group consisting of aportable telephone, a video camera, a portable information terminal, ahead mount display, a projector, an electronic portable book, a personalcomputer, a DVD player, and a digital camera.